Spectroscopic Characterization of the Electronic Structure, Chemical Bonding, and Band Gap in Thermally Annealed Polycrystalline Ga2O3 Thin Films

2019 ◽  
Vol 8 (7) ◽  
pp. Q3249-Q3253 ◽  
Author(s):  
Nanthakishore Makeswaran ◽  
Anil K. Battu ◽  
Roy Swadipta ◽  
Felicia S. Manciu ◽  
C. V. Ramana
Keyword(s):  
Thin Films ◽  
Electronic Structure ◽  
Band Gap ◽  
Chemical Bonding ◽  
Spectroscopic Characterization

Preparation and characterization of V2O5 doped SiO2-TiO2 thin films

2012 ◽  
Vol 2 (1) ◽  
Author(s):  
Marek Nocuń ◽  
Sławomir Kwaśny
Keyword(s):  
Thin Films ◽  
Band Gap ◽  
Photoelectron Spectroscopy ◽  
Sol Gel ◽  
Dip Coating ◽  
Band Gap Energy ◽  
Tio2 Thin Films ◽  
Glass Substrates ◽  
Gel Technique

AbstractIn our investigation, V doped SiO2/TiO2 thin films were prepared on glass substrates by dip coating sol-gel technique. Chemical composition of the samples was studied by X-ray photoelectron spectroscopy (XPS). Transmittance of the samples was characterized using UV-VIS spectrophotometry. Subsequently band-gap energy (Eg) was estimated for these films. Powders obtained from sols were characterized by FTIR spectroscopy. It was found that vanadium decreases optical band gap of SSiO2/TiO2 films.

Fabrication and characterization of wide band-gap CuGaSe2 thin films for tandem structure

2010 ◽  
Vol 10 (3) ◽  
pp. S395-S398 ◽  
Author(s):  
Soon Il Jung ◽  
Kyung Hoon Yoon ◽  
Sejin Ahn ◽  
Jihye Gwak ◽  
Jae Ho Yun
Keyword(s):  
Thin Films ◽  
Band Gap ◽  
Wide Band ◽  
Wide Band Gap ◽  
Tandem Structure ◽  
Fabrication And Characterization

scholarly journals Electronic structure and optical band gap of CoFe2O4 thin films

2012 ◽  
Vol 101 (16) ◽  
pp. 161902 ◽  
Author(s):  
A. V. Ravindra ◽  
P. Padhan ◽  
W. Prellier
Keyword(s):  
Thin Films ◽  
Electronic Structure ◽  
Band Gap ◽  
Optical Band Gap

In situphotoelectron spectroscopic characterization of reactively sputtered, doped vanadium oxide thin films

2016 ◽  
Vol 48 (7) ◽  
pp. 440-444 ◽  
Author(s):  
A. Krammer ◽  
A. Gremaud ◽  
O. Bouvard ◽  
R. Sanjines ◽  
A. Schüler
Keyword(s):  
Thin Films ◽  
Vanadium Oxide ◽  
Spectroscopic Characterization ◽  
Oxide Thin Films ◽  
Vanadium Oxide Thin Films
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