Performance Enhancement for Charge Trapping Memory by Using Al2O3/HfO2/Al2O3Tri-Layer High-κ Dielectrics and High Work Function Metal Gate

2018 ◽  
Vol 7 (6) ◽  
pp. N91-N95 ◽  
Author(s):  
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Zhenhua Wu ◽  
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pp. 252902 ◽  
Author(s):  
Ping-Hung Tsai ◽  
Kuei-Shu Chang-Liao ◽  
Dong-Wei Yang ◽  
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Tien-Ko Wang ◽  
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Kuei-Shu Chang-Liao ◽  
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2015 ◽  
Vol 22 ◽  
pp. 173-179 ◽  
Author(s):  
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