Review—Defect Identification with Positron Annihilation Spectroscopy in Narrow Band Gap Semiconductors
2016 ◽
Vol 5
(4)
◽
pp. P3166-P3171
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1990 ◽
Vol 41
(17)
◽
pp. 12079-12085
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2010 ◽
Vol 42
(1)
◽
pp. 202-207
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