Characteristic Resonance Reflection Spectra of Nanoporous Alumina Films and Its Application to Precise Thickness Measurement

2017 ◽  
Vol 6 (7) ◽  
pp. N92-N96 ◽  
Author(s):  
B. Y. Chu ◽  
H. C. Chui ◽  
C. R. Hsu ◽  
C. K. Chung
Keyword(s):  
Thickness Measurement ◽  
Reflection Spectra ◽  
Nanoporous Alumina ◽  
Alumina Films ◽  
Resonance Reflection

scholarly journals Оптические свойства кремниевых нанопилларов со встроенным вертикальным p-n-переходом

2022 ◽  
Vol 56 (3) ◽  
pp. 340
Author(s):  
Л.С. Басалаева ◽  
А.В. Царев ◽  
К.В. Аникин ◽  
С.Л. Вебер ◽  
Н.В. Крыжановская ◽  
...  
Keyword(s):  
Time Domain ◽  
Finite Difference Time Domain ◽  
Three Dimensional ◽  
Polymeric Coating ◽  
Reflection Spectra ◽  
Ordered Arrays ◽  
Reflection Of Light ◽  
Weak Influence ◽  
Difference Time ◽  
Resonance Reflection

Resonance reflection of light from the ordered arrays of silicon nanopillars (Si NP) was investigated. The height of Si NP was 450 nm. The effect of Si NP oxidation in concentrated nitric acid on the position of resonances in reflection spectra was studied. A weak influence of the additional polymeric coating on the characteristics of reflection from the structures was proven. It is established on the basis of the results of experimental investigation and direct numerical modeling by means of three-dimensional finite difference time domain algorithm (3D FDTD) that the dependence of the resonant wavelength for Si NP on the diameter of Si NP is a linear function with nonzero displacement depending on the pitch.

Fabrication and optical characterization of nanoporous alumina films annealed at different temperatures

2009 ◽  
Vol 31 (6) ◽  
pp. 860-864 ◽  
Author(s):  
L.F. Marsal ◽  
L. Vojkuvka ◽  
P. Formentin ◽  
J. Pallarés ◽  
J. Ferré-Borrull
Keyword(s):  
Optical Characterization ◽  
Nanoporous Alumina ◽  
Alumina Films ◽  
Different Temperatures

Large-Scale Fabrication of Ordered Nanoporous Alumina Films with Arbitrary Pore Intervals by Critical-Potential Anodization

2006 ◽  
Vol 153 (9) ◽  
pp. B384 ◽  
Author(s):  
S. Z. Chu ◽  
K. Wada ◽  
S. Inoue ◽  
M. Isogai ◽  
Y. Katsuta ◽  
...  
Keyword(s):  
Large Scale ◽  
Critical Potential ◽  
Nanoporous Alumina ◽  
Alumina Films

Improved stability of free-standing lipid bilayers based on nanoporous alumina films

2010 ◽  
Vol 96 (21) ◽  
pp. 213706 ◽  
Author(s):  
Ayumi Hirano-Iwata ◽  
Tasuku Taira ◽  
Azusa Oshima ◽  
Yasuo Kimura ◽  
Michio Niwano
Keyword(s):  
Lipid Bilayers ◽  
Free Standing ◽  
Nanoporous Alumina ◽  
Alumina Films ◽  
Improved Stability

Simultaneous determination of layer thicknesses in graded layer materials by ultrasonic non-destructive method

2021 ◽  
Vol 63 (4) ◽  
pp. 229-235
Author(s):  
Chengcheng Zhang ◽  
Xiaoyu Yang ◽  
Guoqiang Luo ◽  
Qiang Shen ◽  
Jian Zhang
Keyword(s):  
Simultaneous Determination ◽  
Thickness Measurement ◽  
Ultrasonic Waves ◽  
Functionally Graded ◽  
Thin Layers ◽  
Reflection Spectra ◽  
Frequency Bandwidth ◽  
Graded Layers ◽  
Convergence Zones

Functionally graded materials (FGMs) are widely applied in aerospace, energy, biology and other fields. Simultaneous determination of the thicknesses of all the graded layers is of great importance in evaluating the quality of an FGM. A model is set up to characterise the ultrasonic waves reflected from an FGM composed of thin layers at normal incidence. The reflection spectrum is derived to simultaneously obtain the thicknesses of the various graded layers. To prove the feasibility of the proposed method, it is applied to measure the layer thicknesses of a prepared Al-Ti bi-layered material specimen without delaminations. An inverse algorithm based on the Gauss-Newton method is introduced to determine the thicknesses by comparing the theoretical and measured reflection spectra. The effects of the frequency bandwidth of the transducer on the thickness convergence zones and the thickness measurement results are investigated. The sensitivity of the proposed method to the thickness parameters is studied. The results indicate that the frequency bandwidth plays an important role in the thickness measurement. The relative thickness errors of the Al layer and the Ti layer in this experiment are –5.28% and +2.77% using 5 MHz and 15 MHz transducers. It is concluded that a combination of reflection spectra and inverse techniques can be employed to simultaneously obtain the graded layer thicknesses.

FORMATION OF NANOPOROUS ALUMINA FILMS WITH TUNGSTEN TRIOXIDE SENSING LAYERS

2005 ◽  
Author(s):  
G. GOROKH ◽  
A. MOZALEV ◽  
D. SOLOVEI ◽  
A. SURGANOV ◽  
V. KHATKO ◽  
...  
Keyword(s):  
Tungsten Trioxide ◽  
Nanoporous Alumina ◽  
Alumina Films
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