Improvement of Stress Stability in Back Channel Etch-Type Amorphous In-Ga-Zn-O Thin Film Transistors with Post Process Annealing
2017 ◽
Vol 6
(5)
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pp. P247-P252
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2019 ◽
Vol 30
(7)
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pp. 6358-6369
2020 ◽
Vol 91
(3)
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pp. 30201
2010 ◽
Vol 130
(2)
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pp. 161-166
Keyword(s):
2015 ◽
Vol 135
(6)
◽
pp. 192-198
◽
Keyword(s):
Keyword(s):
2013 ◽
Vol E96.C
(11)
◽
pp. 1360-1366
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Keyword(s):