(Invited) Practical Strategies for Tuning Optical, Structural and Thermal Properties in Group IV Ternary Semiconductors

2019 ◽  
Vol 33 (6) ◽  
pp. 717-728
Author(s):  
A. V. Chizmeshya ◽  
John Kouvetakis
Author(s):  
J W Steeds

There is a wide range of experimental results related to dislocations in diamond, group IV, II-VI, III-V semiconducting compounds, but few of these come from isolated, well-characterized individual dislocations. We are here concerned with only those results obtained in a transmission electron microscope so that the dislocations responsible were individually imaged. The luminescence properties of the dislocations were studied by cathodoluminescence performed at low temperatures (~30K) achieved by liquid helium cooling. Both spectra and monochromatic cathodoluminescence images have been obtained, in some cases as a function of temperature.There are two aspects of this work. One is mainly of technological significance. By understanding the luminescence properties of dislocations in epitaxial structures, future non-destructive evaluation will be enhanced. The second aim is to arrive at a good detailed understanding of the basic physics associated with carrier recombination near dislocations as revealed by local luminescence properties.


Author(s):  
S. McKernan ◽  
C. B. Carter ◽  
D. Bour ◽  
J. R. Shealy

The growth of ternary III-V semiconductors by organo-metallic vapor phase epitaxy (OMVPE) is widely practiced. It has been generally assumed that the resulting structure is the same as that of the corresponding binary semiconductors, but with the two different cation or anion species randomly distributed on their appropriate sublattice sites. Recently several different ternary semiconductors including AlxGa1-xAs, Gaxln-1-xAs and Gaxln1-xP1-6 have been observed in ordered states. A common feature of these ordered compounds is that they contain a relatively high density of defects. This is evident in electron diffraction patterns from these materials where streaks, which are typically parallel to the growth direction, are associated with the extra reflections arising from the ordering. However, where the (Ga,ln)P epilayer is reasonably well ordered the streaking is extremely faint, and the intensity of the ordered spot at 1/2(111) is much greater than that at 1/2(111). In these cases it is possible to image relatively clearly many of the defects found in the ordered structure.


1960 ◽  
Vol 23 ◽  
pp. 332-336 ◽  
Author(s):  
W WENDLANDT ◽  
J VANTASSEL ◽  
G ROBERTHORTON
Keyword(s):  

1990 ◽  
Vol 137 (3) ◽  
pp. 155 ◽  
Author(s):  
C.A. Millar ◽  
T.J. Whitley ◽  
S.C. Fleming

2005 ◽  
Vol 125 ◽  
pp. 309-311 ◽  
Author(s):  
S. García ◽  
E. Marín ◽  
O. Delgado-Vasallo ◽  
J. Portelles ◽  
G. Peña Rodríguez ◽  
...  
Keyword(s):  

1976 ◽  
Vol 37 (C6) ◽  
pp. C6-893-C6-896 ◽  
Author(s):  
G. WEYER ◽  
G. GREBE ◽  
A. KETTSCHAU ◽  
B. I. DEUTCH ◽  
A. NYLANDSTED LARSEN ◽  
...  

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