The Influence of the Hafnium Doping on Negative Bias Stability in Zinc Oxide Thin Film Transistor

2010 ◽  
Vol 13 (9) ◽  
pp. H295 ◽  
Author(s):  
Woong-Sun Kim ◽  
Yeon-Keon Moon ◽  
Kyung-Taek Kim ◽  
Sae-Young Shin ◽  
Byung Du Ahn ◽  
...  
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistor ◽  
Oxide Thin Film ◽  
Negative Bias ◽  
Zinc Oxide Thin Film ◽  
Bias Stability

Influence of Illumination on the Negative-Bias Stability of Transparent Hafnium–Indium–Zinc Oxide Thin-Film Transistors

2010 ◽  
Vol 31 (5) ◽  
pp. 440-442 ◽  
Author(s):  
Joon Seok Park ◽  
Tae Sang Kim ◽  
Kyoung Seok Son ◽  
Ji Sim Jung ◽  
Kwang-Hee Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Negative Bias ◽  
Zinc Oxide Thin Film ◽  
Indium Zinc Oxide ◽  
Bias Stability

Improvement in the negative bias stability of zinc oxide thin-film transistors by hafnium doping

2013 ◽  
Vol 13 ◽  
pp. S98-S102 ◽  
Author(s):  
Dong-Suk Han ◽  
Dae-Yong Moon ◽  
Yu-Jin Kang ◽  
Jae-Hyung Park ◽  
Jong-Wan Park
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Negative Bias ◽  
Zinc Oxide Thin Film ◽  
Bias Stability

scholarly journals Effect of top gate potential on bias-stress for dual gate amorphous indium-gallium-zinc-oxide thin film transistor

AIP Advances ◽  
2016 ◽  
Vol 6 (7) ◽  
pp. 075217 ◽  
Author(s):  
Minkyu Chun ◽  
Jae Gwang Um ◽  
Min Sang Park ◽  
Md Delwar Hossain Chowdhury ◽  
Jin Jang
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistor ◽  
Oxide Thin Film ◽  
Indium Gallium Zinc Oxide ◽  
Zinc Oxide Thin Film ◽  
Bias Stress ◽  
Dual Gate ◽  
Gate Potential ◽  
Indium Gallium
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