Consistent Discussion of the Uncertainty of Physical Parameters Evaluated by EIS, Based on an Automatic Measurement Error Determination.

2019 ◽  
Vol 25 (32) ◽  
pp. 49-62 ◽  
Author(s):  
Carl-Albrecht Schiller ◽  
Rüdiger Kaus
Keyword(s):  
Measurement Error ◽  
Automatic Measurement ◽  
Physical Parameters ◽  
Error Determination

Research of On-Line Large-Size Forging Measurement System Based on LabVIEW

2012 ◽  
Vol 430-432 ◽  
pp. 1577-1580
Author(s):  
Xian Ling Zhao ◽  
Jian Sheng Liu
Keyword(s):  
Measurement Error ◽  
Laser Beam ◽  
Measurement Errors ◽  
Three Dimensional ◽  
Automatic Measurement ◽  
Manual Measurement ◽  
Large Size ◽  
On Line ◽  
Large Measurement ◽  
Time Changes

Forging temperature is usually around 1000°C in free forging scene. Manual measurement leads to large measurement errors. Adopting the non-contact 3D scanning technology, make the laser beam sweep across the forging surface to get three-dimensional coordinates of the points on the forging surface in space. Neighboring scan points separate by less than 0.25mm. The measurement error is less than 6mm. The coordinate,s data are sent to the LabVIEW procedure. The procedure analyzes the coordinates to calculate the size of the large-size forging to realize automatic measurement of the forgings. The procedure can also reconstruct the image of the large-size forging. These make us detect the real-time changes of the forging far from the free forging scene.

Some Results of the Spectroscopic Study of Four Close Binary Systems of Early Spectral Types

1965 ◽  
Vol 5 ◽  
pp. 120-130
Author(s):  
T. S. Galkina
Keyword(s):  
Spectroscopic Study ◽  
Spectral Type ◽  
Spectroscopic Investigation ◽  
Binary Systems ◽  
Quantitative Information ◽  
Close Binary ◽  
Physical Parameters ◽  
Absorption And Emission ◽  
Close Binary Systems ◽  
Quantitative Estimates

It is necessary to have quantitative estimates of the intensity of lines (both absorption and emission) to obtain the physical parameters of the atmosphere of components.Some years ago at the Crimean observatory we began the spectroscopic investigation of close binary systems of the early spectral type with components WR, Of, O, B to try and obtain more quantitative information from the study of the spectra of the components.

A theory of contamination in electron microscopes by surface diffusion

1978 ◽  
Vol 36 (1) ◽  
pp. 116-117
Author(s):  
J.T. Fourie
Keyword(s):  
Electron Beam ◽  
Surface Diffusion ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Physical Parameters ◽  
Carbon Compounds ◽  
Hydrocarbon Molecules ◽  
Electron Microscopes ◽  
Primary Electrons ◽  
Long Chain

Contamination in electron microscopes can be a serious problem in STEM or in situations where a number of high resolution micrographs are required of the same area in TEM. In modern instruments the environment around the specimen can be made free of the hydrocarbon molecules, which are responsible for contamination, by means of either ultra-high vacuum or cryo-pumping techniques. However, these techniques are not effective against hydrocarbon molecules adsorbed on the specimen surface before or during its introduction into the microscope. The present paper is concerned with a theory of how certain physical parameters can influence the surface diffusion of these adsorbed molecules into the electron beam where they are deposited in the form of long chain carbon compounds by interaction with the primary electrons.

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

Electron Microscopy in the Study of Natural Phytoplankton Assemblages

1985 ◽  
Vol 43 ◽  
pp. 620-623
Author(s):  
Linda Sicko-Goad
Keyword(s):  
Electron Microscopy ◽  
Aquatic Environment ◽  
Size Range ◽  
Physical Parameters ◽  
Specific Information ◽  
Phytoplankton Assemblages ◽  
Phytoplankton Productivity ◽  
Ecosystem Effects ◽  
Time Of Year ◽  
Species Specific

Although the use of electron microscopy and its varied methodologies is not usually associated with ecological studies, the types of species specific information that can be generated by these techniques are often quite useful in predicting long-term ecosystem effects. The utility of these techniques is especially apparent when one considers both the size range of particles found in the aquatic environment and the complexity of the phytoplankton assemblages.The size range and character of organisms found in the aquatic environment are dependent upon a variety of physical parameters that include sampling depth, location, and time of year. In the winter months, all the Laurentian Great Lakes are uniformly mixed and homothermous in the range of 1.1 to 1.7°C. During this time phytoplankton productivity is quite low.

A New Numerical Model for Electron-Probe Analysis at High Depth Resolution

1996 ◽  
Vol 54 ◽  
pp. 490-491
Author(s):  
P.-F. Staub ◽  
C. Bonnelle ◽  
F. Vergand ◽  
P. Jonnard
Keyword(s):  
Electron Probe ◽  
Surface Segregation ◽  
Depth Distribution ◽  
Computing Time ◽  
Depth Resolution ◽  
Physical Parameters ◽  
Electron Probe Analysis ◽  
Interface Phases ◽  
Excitation Conditions ◽  
High Depth

Characterizing dimensionally and chemically nanometric structures such as surface segregation or interface phases can be performed efficiently using electron probe (EP) techniques at very low excitation conditions, i.e. using small incident energies (0.5<E0<5 keV) and low incident overvoltages (1<U0<1.7). In such extreme conditions, classical analytical EP models are generally pushed to their validity limits in terms of accuracy and physical consistency, and Monte-Carlo simulations are not convenient solutions as routine tools, because of their cost in computing time. In this context, we have developed an intermediate procedure, called IntriX, in which the ionization depth distributions Φ(ρz) are numerically reconstructed by integration of basic macroscopic physical parameters describing the electron beam/matter interaction, all of them being available under pre-established analytical forms. IntriX’s procedure consists in dividing the ionization depth distribution into three separate contributions:

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