Characterization of SOFC Electrode Microstructure Using Nano-Scale X-ray Computed Tomography and Focused Ion Beam Techniques: a Comparative Study

2019 ◽  
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Author(s):  
Paul R. Shearing ◽  
Jeff Gelb ◽  
Nigel Brandon
2018 ◽  
Vol 1566 ◽  
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Author(s):  
T.F. Johnson ◽  
J.J. Bailey ◽  
F. Iacoviello ◽  
J.H. Welsh ◽  
P.R. Levison ◽  
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2013 ◽  
Vol 19 (S2) ◽  
pp. 630-631
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P. Mandal ◽  
W.K. Epting ◽  
S. Litster

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.


2018 ◽  
Vol 139 ◽  
pp. 75-82 ◽  
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A.H. Galmed ◽  
A. du Plessis ◽  
S.G. le Roux ◽  
E. Hartnick ◽  
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2011 ◽  
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Nobuhiko Ito ◽  
Sulan Dai ◽  
Teruhiko Aoyagi ◽  
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