Annealing-temperature Dependence of Compositional Depth Profiles and Chemical Bonding States of CeOx/LaOx/Si and LaOx/CeOx/Si Structure

Hiroshi Nohira; Youichirou Kon; Koji Kitamura; Miyuki Kouda; Kuniyuki Kakushima; Hiroshi Iwai

doi:10.1149/1.3206630

Annealing-temperature Dependence of Compositional Depth Profiles and Chemical Bonding States of CeOx/LaOx/Si and LaOx/CeOx/Si Structure

ECS Transactions ◽

10.1149/1.3206630 ◽

2019 ◽

Vol 25 (6) ◽

pp. 321-326 ◽

Cited By ~ 5

Author(s):

Hiroshi Nohira ◽

Youichirou Kon ◽

Koji Kitamura ◽

Miyuki Kouda ◽

Kuniyuki Kakushima ◽

...

Keyword(s):

Temperature Dependence ◽

Chemical Bonding ◽

Annealing Temperature ◽

Depth Profiles ◽

Annealing Temperature Dependence

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Annealing-temperature Dependence of Compositional Depth Profiles and Chemical Bonding States of CeOx/LaOx/Si and LaOx/CeOx/Si Structure

ECS Meeting Abstracts ◽

10.1149/ma2009-02/25/2133 ◽

2009 ◽

Keyword(s):

Temperature Dependence ◽

Chemical Bonding ◽

Annealing Temperature ◽

Depth Profiles ◽

Annealing Temperature Dependence

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Annealing temperature dependence of the performance of bulk heterojunction polymer: Fullerene solar cells under short and open circuit conditions

Synthetic Metals ◽

10.1016/j.synthmet.2020.116611 ◽

2021 ◽

Vol 271 ◽

pp. 116611

Author(s):

M. Radaoui ◽

A. Ben Fredj ◽

S. Romdhane ◽

D.A.M. Egbe ◽

H. Bouchriha

Keyword(s):

Solar Cells ◽

Temperature Dependence ◽

Annealing Temperature ◽

Bulk Heterojunction ◽

Open Circuit ◽

Annealing Temperature Dependence

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Current perpendicular-to-plane giant magnetoresistance using anL12Ag3Mgspacer andCo2Fe0.4Mn0.6SiHeusler alloy electrodes: Spacer thickness and annealing temperature dependence

Physical Review Materials ◽

10.1103/physrevmaterials.1.044402 ◽

2017 ◽

Vol 1 (4) ◽

Cited By ~ 10

Author(s):

Takahide Kubota ◽

Yusuke Ina ◽

Zhenchao Wen ◽

Hiroyuki Narisawa ◽

Koki Takanashi

Keyword(s):

Temperature Dependence ◽

Giant Magnetoresistance ◽

Annealing Temperature ◽

Current Perpendicular To Plane ◽

Spacer Thickness ◽

Annealing Temperature Dependence

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Thickness and annealing temperature dependence of perpendicular exchange biasing in [Pd/Co]/FeMn multilayers

INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005. ◽

10.1109/intmag.2005.1464463 ◽

2005 ◽

Author(s):

H.W. Joo ◽

S.W. Kim ◽

M.S. Lee ◽

J.H. An ◽

S.D. Choi ◽

...

Keyword(s):

Temperature Dependence ◽

Annealing Temperature ◽

Exchange Biasing ◽

Annealing Temperature Dependence

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Annealing temperature dependence of photoluminescent characteristics of silicon nanocrystals embedded in silicon-rich silicon nitride films grown by PECVD

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2012.12.096 ◽

2013 ◽

Vol 307 ◽

pp. 344-348 ◽

Cited By ~ 4

Author(s):

D.S. Chao ◽

J.H. Liang

Keyword(s):

Silicon Nitride ◽

Temperature Dependence ◽

Silicon Nanocrystals ◽

Annealing Temperature ◽

Silicon Nitride Films ◽

Annealing Temperature Dependence

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The annealing temperature dependence of anatase TiO2thin films prepared by the electron-beam evaporation method

Semiconductor Science and Technology ◽

10.1088/0268-1242/31/12/125012 ◽

2016 ◽

Vol 31 (12) ◽

pp. 125012 ◽

Cited By ~ 31

Author(s):

Atefeh Taherniya ◽

Davood Raoufi

Keyword(s):

Electron Beam ◽

Temperature Dependence ◽

Annealing Temperature ◽

Electron Beam Evaporation ◽

Evaporation Method ◽

Annealing Temperature Dependence

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Annealing Temperature Dependence of Photoluminescence from Silicon-Rich Silica Films

Plasma Science and Technology ◽

10.1088/1009-0630/3/4/009 ◽

2001 ◽

Vol 3 (4) ◽

pp. 891-895

Author(s):

Wu Xue-mei ◽

Zhuge Lan-jian ◽

Tang Nai-yun ◽

Ye Chun-nuan ◽

Ning Zao-yuan ◽

...

Keyword(s):

Temperature Dependence ◽

Annealing Temperature ◽

Silica Films ◽

Annealing Temperature Dependence

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Annealing-temperature Dependence of Compositional Depth Profile and Chemical Structures of LaOx/ScOx/Si and ScOx/LaOx/Si Interfacial Transition Layer

ECS Transactions ◽

10.1149/1.2981599 ◽

2019 ◽

Vol 16 (5) ◽

pp. 171-176 ◽

Cited By ~ 1

Author(s):

Hiroshi Nohira ◽

Yoshinori Takenaga ◽

Kuniyuki Kakushima ◽

Parhat Ahmet ◽

Kazuo Tsutsui ◽

...

Keyword(s):

Temperature Dependence ◽

Depth Profile ◽

Transition Layer ◽

Annealing Temperature ◽

Chemical Structures ◽

Compositional Depth Profile ◽

Annealing Temperature Dependence

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Testing field and annealing temperature dependence of leakage properties in Bi3.25La0.75Ti3O12 thin films

Thin Solid Films ◽

10.1016/j.tsf.2010.11.021 ◽

2011 ◽

Vol 519 (7) ◽

pp. 2376-2380 ◽

Cited By ~ 3

Author(s):

Xiumei Wu ◽

Shuai Dong ◽

Ya Zhai ◽

Mingxiang Xu ◽

Yi Kan

Keyword(s):

Thin Films ◽

Temperature Dependence ◽

Annealing Temperature ◽

Testing Field ◽

Annealing Temperature Dependence

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Ti-content and annealing temperature dependence of deformation characteristics of TiXNi(92−X)Cu8 shape memory alloys

Acta Materialia ◽

10.1016/s1359-6454(97)00479-5 ◽

1998 ◽

Vol 46 (8) ◽

pp. 2729-2740 ◽

Cited By ~ 18

Author(s):

S.M. Tan ◽

V.H. No ◽

S. Miyazaki

Keyword(s):

Shape Memory Alloys ◽

Shape Memory ◽

Temperature Dependence ◽

Annealing Temperature ◽

Deformation Characteristics ◽

Ti Content ◽

Annealing Temperature Dependence

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