The Characterization of Bottom-gate Thin Film Transistors adapted Nanocrystalline Silicon as Active Layer by Catalytic CVD at Low Temperature

2019 ◽  
Vol 25 (3) ◽  
pp. 259-262
Author(s):  
Youn-Jin Lee ◽  
Kyoung-Min Lee ◽  
Jae-Dam Hwang ◽  
Kil-Sun No ◽  
Kap Soo Yoon ◽  
...  
2010 ◽  
pp. NA-NA
Author(s):  
O. Moustapha ◽  
A. Abramov ◽  
D. Daineka ◽  
M. Oudwan ◽  
Y. Bonnassieux ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document