Semiconductor Thin Film Characterization with ac Surface Photo Voltage

2019 ◽  
Vol 25 (3) ◽  
pp. 119-128 ◽  
Author(s):  
Edward Tsidilkovski
Keyword(s):  
Thin Film ◽  
Thin Film Characterization ◽  
Semiconductor Thin Film

Helicity dependent temporal profile of the semiconductor thin film photoresponse

2021 ◽  
Vol 118 (20) ◽  
pp. 201105
Author(s):  
Gennady M. Mikheev ◽  
Arseniy E. Fateev ◽  
Vladimir Ya. Kogai ◽  
Tatyana N. Mogileva ◽  
Viatcheslav V. Vanyukov ◽  
...  
Keyword(s):  
Thin Film ◽  
Temporal Profile ◽  
Semiconductor Thin Film

High-temperature superconductor thin-film characterization by the modulated optical reflectance technique

1995 ◽  
Vol 8 (8) ◽  
pp. 667-672 ◽  
Author(s):  
D P Almond ◽  
A K Barker ◽  
A C Bento ◽  
S K Singh ◽  
N J Appleyard ◽  
...  
Keyword(s):  
Thin Film ◽  
High Temperature ◽  
High Temperature Superconductor ◽  
Optical Reflectance ◽  
Thin Film Characterization
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