Piezoelectric Stimulation of Microcantilever Beams for Young's Modulus Determination of Amorphous Hydrogenated Silicon Carbide

2019 ◽  
Vol 14 (1) ◽  
pp. 63-71 ◽  
Author(s):  
Gustavo P. Rehder ◽  
Marcelo N. Carreño
2006 ◽  
Vol 911 ◽  
Author(s):  
Jiangang Du ◽  
Neha Singh ◽  
James B. Summers ◽  
Christian A. Zorman

AbstractThis paper reports our effort to develop amorphous hydrogenated silicon carbide (a-SiC:H ) films specifically designed for MEMS applications using a semiconductor-grade organosilane known as trimethylsilane (3MS) as the precursor. In our work, the a-SiC:H films were deposited in a commercial PECVD system at a fixed temperature of 350˚C using 3MS diluted in helium (He). Films with thicknesses from ~ 100 nm to ~ 2μm, a typical range for MEMS applications, were deposited. Deposition parameters such RF power, deposition pressure, and 3MS-to-He ratio were explored to obtain films with low residual compressive stresses. Low temperature, post-deposition annealing at 450˚C was used to convert the as-deposited compressive residual stresses to moderate tensile stresses, which are desired for micromachined bridges, membranes and other anchored structures. Compositional analysis indicated that films with a Si-to-C ratio of 1 could be deposited under certain conditions. Mechanical properties such as Young's modulus and fracture strength were derived from the load-deflection behavior of micromachined freestanding membranes. Nanoindentation was used to verify the Young's modulus and determine the hardness. As expected, the films exhibit insulating properties with a relative dielectric constant at 3.90 for as-deposited films and 2.69 after annealing at 1100˚C, as determined from C-V measurements. Chemical inertness was tested in aqueous, corrosive solutions such as KOH and HNA. Prototype structures were fabricated using both surface micromachining and bulk micromachining techniques to demonstrate the potential of the a-SiC:H films for MEMS applications.


2020 ◽  
Vol 12 ◽  
Author(s):  
S.V. Kontomaris ◽  
A. Malamou ◽  
A. Stylianou

Background: The determination of the mechanical properties of biological samples using Atomic Force Microscopy (AFM) at the nanoscale is usually performed using basic models arising from the contact mechanics theory. In particular, the Hertz model is the most frequently used theoretical tool for data processing. However, the Hertz model requires several assumptions such as homogeneous and isotropic samples and indenters with perfectly spherical or conical shapes. As it is widely known, none of these requirements are 100 % fulfilled for the case of indentation experiments at the nanoscale. As a result, significant errors arise in the Young’s modulus calculation. At the same time, an analytical model that could account complexities of soft biomaterials, such as nonlinear behavior, anisotropy, and heterogeneity, may be far-reaching. In addition, this hypothetical model would be ‘too difficult’ to be applied in real clinical activities since it would require very heavy workload and highly specialized personnel. Objective: In this paper a simple solution is provided to the aforementioned dead-end. A new approach is introduced in order to provide a simple and accurate method for the mechanical characterization at the nanoscale. Method: The ratio of the work done by the indenter on the sample of interest to the work done by the indenter on a reference sample is introduced as a new physical quantity that does not require homogeneous, isotropic samples or perfect indenters. Results: The proposed approach, not only provides an accurate solution from a physical perspective but also a simpler solution which does not require activities such as the determination of the cantilever’s spring constant and the dimensions of the AFM tip. Conclusion: The proposed, by this opinion paper, solution aims to provide a significant opportunity to overcome the existing limitations provided by Hertzian mechanics and apply AFM techniques in real clinical activities.


Materials ◽  
2021 ◽  
Vol 14 (2) ◽  
pp. 328
Author(s):  
Kamil Anasiewicz ◽  
Józef Kuczmaszewski

This article is an evaluation of the phenomena occurring in adhesive joints during curing and their consequences. Considering changes in the values of Young’s modulus distributed along the joint thickness, and potential changes in adhesive strength in the cured state, the use of a numerical model may make it possible to improve finite element simulation effects and bring their results closer to experimental data. The results of a tensile test of a double overlap adhesive joint sample, performed using an extensometer, are presented. This test allowed for the precise determination of the shear modulus G of the cured adhesive under experimental conditions. Then, on the basis of the research carried out so far, a numerical model was built, taking the differences observed in the properties of the joint material into account. The stress distribution in a three-zone adhesive joint was analyzed in comparison to the standard numerical model in which the adhesive in the joint was treated as isotropic. It is proposed that a joint model with three-zones, differing in the Young’s modulus values, is more accurate for mapping the experimental results.


2018 ◽  
Vol 233 ◽  
pp. 00025
Author(s):  
P.V. Polydoropoulou ◽  
K.I. Tserpes ◽  
Sp.G. Pantelakis ◽  
Ch.V. Katsiropoulos

In this work a multi-scale model simulating the effect of the dispersion, the waviness as well as the agglomerations of MWCNTs on the Young’s modulus of a polymer enhanced with 0.4% MWCNTs (v/v) has been developed. Representative Unit Cells (RUCs) have been employed for the determination of the homogenized elastic properties of the MWCNT/polymer. The elastic properties computed by the RUCs were assigned to the Finite Element (FE) model of a tension specimen which was used to predict the Young’s modulus of the enhanced material. Furthermore, a comparison with experimental results obtained by tensile testing according to ASTM 638 has been made. The results show a remarkable decrease of the Young’s modulus for the polymer enhanced with aligned MWCNTs due to the increase of the CNT agglomerations. On the other hand, slight differences on the Young’s modulus have been observed for the material enhanced with randomly-oriented MWCNTs by the increase of the MWCNTs agglomerations, which might be attributed to the low concentration of the MWCNTs into the polymer. Moreover, the increase of the MWCNTs waviness led to a significant decrease of the Young’s modulus of the polymer enhanced with aligned MWCNTs. The experimental results in terms of the Young’s modulus are predicted well by assuming a random dispersion of MWCNTs into the polymer.


1998 ◽  
Vol 1 (2) ◽  
pp. 81-85
Author(s):  
Clara EE Hanekamp ◽  
Hans JRM Bonnier ◽  
Rolf H Michels ◽  
Kathinka H Peels ◽  
Eric PCM Heijmen ◽  
...  

1928 ◽  
Vol 24 (2) ◽  
pp. 276-279
Author(s):  
C. F. Sharman

There are two general methods of measuring the elastic constants of bodies; one involves a study of the static deformation produced by the appropriate kind of stress, and the other a measurement of the period of oscillation of a system of known inertia under the elastic forces.


2003 ◽  
Vol 17 (09) ◽  
pp. 387-392 ◽  
Author(s):  
NIKIFOR RAKOV ◽  
ARSHAD MAHMOOD ◽  
MUFEI XIAO

Amorphous hydrogenated silicon carbide (a-SiC:H) thin films have been prepared by the RF reactive magnetron sputtering technique. The optical properties of the films have been studied by optical spectroscopy with an incoherent light source. The material is commonly regarded as a dielectric. We have discovered however that some films that were prepared under certain deposition conditions and on certain substrates may respond to external light as a metallic thin film, i.e. there are strongly enhanced reflection peaks in the optical spectrum. We have further discovered that some films may have a strong and broadened absorption peak at about 590 nm, which is an apparent photonic bandgap in the visible spectrum. The appearance of the photonic bandgap is very sensitive to two parameters: the substrate and the deposition gas. By changing the two parameters, one shifts the status of the film from with and without the photonic bandgap.


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