Transient Overgrowth of a Resistive Barrier Layer by Electrodeposited Metal in the Presence of Additives

2019 ◽  
Vol 6 (8) ◽  
pp. 89-103
Author(s):  
Matthew Willis ◽  
R. Alkire
Keyword(s):  
Barrier Layer ◽  
Electrodeposited Metal

Deposited emulsion particles in the pores of aluminum oxide film

1978 ◽  
Vol 36 (1) ◽  
pp. 450-451
Author(s):  
Michio Ashida ◽  
Yasukiyo Ueda
Keyword(s):  
Oxide Film ◽  
Acid Solution ◽  
Barrier Layer ◽  
Colloidal Particles ◽  
Oxalic Acid Solution ◽  
Anodic Oxide ◽  
Anodic Oxide Film ◽  
Carbon Replica ◽  
Sectioning Method ◽  
Thin Sectioning

An anodic oxide film is formed on aluminum in an acidic elecrolyte during anodizing. The structure of the oxide film was observed directly by carbon replica method(l) and ultra-thin sectioning method(2). The oxide film consists of barrier layer and porous layer constructed with fine hexagonal cellular structure. The diameter of micro pores and the thickness of barrier layer depend on the applying voltage and electrolyte. Because the dimension of the pore corresponds to that of colloidal particles, many metals deposit in the pores. When the oxide film is treated as anode in emulsion of polyelectrolyte, the emulsion particles migrate onto the film and deposit on it. We investigated the behavior of the emulsion particles during electrodeposition.Aluminum foils (99.3%) were anodized in either 0.25M oxalic acid solution at 30°C or 3M sulfuric acid solution at 20°C. After washing with distilled water, the oxide films used as anode were coated with emulsion particles by applying voltage of 200V and then they were cured at 190°C for 30 minutes.

Barrier layer at metal-ceramic interface in ferroelectric MIM structures

1993 ◽  
Vol 3 (8) ◽  
pp. 1617-1623
Author(s):  
P. Gaucher ◽  
J. Hector ◽  
J. P. Ganne
Keyword(s):  
Barrier Layer ◽  
Metal Ceramic

SYNTHESIS OF KESTERITE LAYERS OBTAINED BY SULFURIZATION OF ELECTRODEPOSITED METAL PRECURSORS

2015 ◽  
Vol 74 (5) ◽  
pp. 431-443 ◽  
Author(s):  
A.V. Momotenko ◽  
N. P. Klochko ◽  
V.M. Lyubov ◽  
V. R. Kopach ◽  
G.S. Khrypunov
Keyword(s):  
Metal Precursors ◽  
Electrodeposited Metal

The Effect of Ball Pad Metallurgy and Ball Composition on Solder Ball Integrity of Plastic Ball Grid Array Packages

1998 ◽  
Author(s):  
C.H. Zhong ◽  
Sung Yi
Keyword(s):  
Failure Mode ◽  
Barrier Layer ◽  
Shear Force ◽  
Solder Ball ◽  
Ball Grid Array ◽  
Reliability Test ◽  
Shear Forces ◽  
Ball Shear ◽  
Plastic Ball ◽  
Plastic Ball Grid Array

Abstract Ball shear forces of plastic ball grid array (PBGA) packages are found to decrease after reliability test. Packages with different ball pad metallurgy form different intermetallic compounds (IMC) thus ball shear forces and failure modes are different. The characteristic and dynamic process of IMC formed are decided by ball pad metallurgy which includes Ni barrier layer and Au layer thickness. Solder ball composition also affects IMC formation dynamic process. There is basically no difference in ball shear force and failure mode for packages with different under ball pad metallurgy before reliability test. However shear force decreased and failure mode changed after reliability test, especially when packages exposed to high temperature. Major difference in ball shear force and failure mode was found for ball pad metallurgy of Ni barrier layer including Ni-P, pure Ni and Ni-Co. Solder ball composition was found to affect the IMC formation rate.

’Propylene glycolate’ used as a top coat seal to protect thick juice from degradation in ellipsoidal storage tanks

2013 ◽  
pp. 215-218
Author(s):  
Robert O. Hatch ◽  
Craig M. Giles ◽  
Jay S. Creiglow ◽  
David R. Smith
Keyword(s):  
Propylene Glycol ◽  
Barrier Layer ◽  
Chemical Properties ◽  
Polypropylene Glycol ◽  
Storage Tanks ◽  
First Results ◽  
Thick Juice

The use of sodium propylene glycol for thick juice storage was investigated at Spreckels Sugar Company, in Brawley, California (USA). Sodium-polypropylene glycol has a density of 1.07 and does not mix with thick juice. Therefore it is suitable as a barrier layer. Chemical properties of propylene glycol, and the deposition on the top of thick juice are described. First results of the last campaign are compared with data from previous years. A significantly lower tendency in the reduction of the quality of the thick juice was found.

Effect of Amorphous Co-W Barrier Layer on the Evolution of Sn/Cu Interface

2019 ◽  
Author(s):  
Shuhui Chen ◽  
Menglong Sun ◽  
Anmin Hu ◽  
Huiqin Ling ◽  
Tao Hang ◽  
...  
Keyword(s):  
Barrier Layer

scholarly journals The Primary Origin of Excellent Dielectric Properties of (Co, Nb) Co-Doped TiO2 Ceramics: Electron-Pinned Defect Dipoles vs. Internal Barrier Layer Capacitor Effect

Molecules ◽  
2021 ◽  
Vol 26 (11) ◽  
pp. 3230
Author(s):  
Theeranuch Nachaithong ◽  
Narong Chanlek ◽  
Pairot Moontragoon ◽  
Prasit Thongbai
Keyword(s):  
Dielectric Properties ◽  
Loss Tangent ◽  
Barrier Layer ◽  
Dielectric Response ◽  
High Resistivity ◽  
Low Loss ◽  
Rutile Tio2 ◽  
Complex Defect ◽  
Very High ◽  
Co Doped

(Co, Nb) co-doped rutile TiO2 (CoNTO) nanoparticles with low dopant concentrations were prepared using a wet chemistry method. A pure rutile TiO2 phase with a dense microstructure and homogeneous dispersion of the dopants was obtained. By co-doping rutile TiO2 with 0.5 at.% (Co, Nb), a very high dielectric permittivity of ε′ » 36,105 and a low loss tangent of tanδ » 0.04 were achieved. The sample–electrode contact and resistive outer-surface layer (surface barrier layer capacitor) have a significant impact on the dielectric response in the CoNTO ceramics. The density functional theory calculation shows that the 2Co atoms are located near the oxygen vacancy, creating a triangle-shaped 2CoVoTi complex defect. On the other hand, the substitution of TiO2 with Nb atoms can form a diamond-shaped 2Nb2Ti complex defect. These two types of complex defects are far away from each other. Therefore, the electron-pinned defect dipoles cannot be considered the primary origins of the dielectric response in the CoNTO ceramics. Impedance spectroscopy shows that the CoNTO ceramics are electrically heterogeneous, comprised of insulating and semiconducting regions. Thus, the dielectric properties of the CoNTO ceramics are attributed to the interfacial polarization at the internal insulating layers with very high resistivity, giving rise to a low loss tangent.

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