Structural and Electrical Characterization of Dielectrics, Carbon Nanotubes and Nanoelectronic Devices by Means of Scanning Probe Microscopy

2019 ◽  
Vol 10 (1) ◽  
pp. 129-140
Author(s):  
Udo Schwalke
Keyword(s):  
Carbon Nanotubes ◽  
Scanning Probe Microscopy ◽  
Electrical Characterization ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Nanoelectronic Devices

Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films

2013 ◽  
Vol 53 (9-11) ◽  
pp. 1430-1433 ◽  
Author(s):  
Alexander Hofer ◽  
Roland Biberger ◽  
Günther Benstetter ◽  
Björn Wilke ◽  
Holger Göbel
Keyword(s):  
Organic Semiconductor ◽  
Scanning Probe Microscopy ◽  
Electrical Characterization ◽  
Scanning Probe ◽  
Semiconductor Films ◽  
Probe Microscopy

Characterization of carbon nanotubes by scanning probe microscopy

1993 ◽  
Vol 281 (3) ◽  
pp. L335-L340 ◽  
Author(s):  
Mark J. Gallagher ◽  
Dong Chen ◽  
Bruce P. Jacobsen ◽  
Dror Sarid ◽  
Lowell D. Lamb ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy

Local electrical characterization of SOI wafers by scanning probe microscopy

2002 ◽  
Vol 91-92 ◽  
pp. 156-159 ◽  
Author(s):  
Yoshimori Ishizuka ◽  
Takayuki Uchihashi ◽  
Haruhiko Yoshida ◽  
Seigo Kishino
Keyword(s):  
Scanning Probe Microscopy ◽  
Electrical Characterization ◽  
Scanning Probe ◽  
Probe Microscopy

Characterization of carbon nanotubes by scanning probe microscopy

1993 ◽  
Vol 281 (3) ◽  
pp. 335-340 ◽  
Author(s):  
Mark J. Gallagher ◽  
Dong Chen ◽  
Bruce P. Jacobsen ◽  
Dror Sarid ◽  
Lowell D. Lamb ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy
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