Si Nanocrystal Memory Devices Self-Assembled by In Situ Rapid Thermal Annealing of Ultrathin a-Si on SiO[sub 2]

2007 ◽  
Vol 10 (10) ◽  
pp. H302 ◽  
Author(s):  
Jian-Hao Chen ◽  
Tan-Fu Lei ◽  
Dolf Landheer ◽  
Xiaohua Wu ◽  
Jian Liu ◽  
...  
2012 ◽  
Vol 33 (12) ◽  
pp. 1705-1707 ◽  
Author(s):  
Dandan Jiang ◽  
Manhong Zhang ◽  
Zongliang Huo ◽  
Zhong Sun ◽  
Yong Wang ◽  
...  

1987 ◽  
Vol 102 ◽  
Author(s):  
M. Cerullo ◽  
Julia M. Phillips ◽  
M. Anzlowar ◽  
L. Pfeiffer ◽  
J. L. Batstone ◽  
...  

ABSTRACTA new in-situ rapid thermal annealing (RTA) apparatus which can be used to anneal entire wafers in an ultra high vacuum environment has been designed to be used in conjunction with the epitaxial growth of heterostructures. Drastic improvement in the crystallinity of CaF2/Si(100) can be achieved with RTA, and our results suggest that RTA can be used as an on-line processing technique for novel epitaxial structures.


2000 ◽  
Vol 208 (1-4) ◽  
pp. 791-794 ◽  
Author(s):  
Q.D Zhuang ◽  
J.M Li ◽  
X.X Wang ◽  
Y.P Zeng ◽  
Y.T Wang ◽  
...  

2009 ◽  
Vol 106 (7) ◽  
pp. 073106 ◽  
Author(s):  
Jihoon H. Lee ◽  
Zhiming M. Wang ◽  
Vitaliy G. Dorogan ◽  
Yuiry I. Mazur ◽  
Morgan E. Ware ◽  
...  

2000 ◽  
Vol 76 (18) ◽  
pp. 2538-2540 ◽  
Author(s):  
Byung Hak Lee ◽  
Kee Sun Lee ◽  
Dong Kyun Sohn ◽  
Jeong Soo Byun ◽  
Chang Hee Han ◽  
...  

1997 ◽  
Vol 18 (11) ◽  
pp. 526-528 ◽  
Author(s):  
Chyuan Haur Kao ◽  
Chao Sung Lai ◽  
Chung Len Lee

2014 ◽  
Vol 59 (5) ◽  
pp. 711-715 ◽  
Author(s):  
E. A. Bogoyavlenskaya ◽  
V. I. Rudakov ◽  
Yu. I. Denisenko ◽  
V. V. Naumov ◽  
A. E. Rogozhin

Sign in / Sign up

Export Citation Format

Share Document