Precise Analysis of Si/Graded-Si1-xGex/Si1-xGex Heterostructure Films Grown by Reduced Pressure Chemical Vapor Deposition Using Spectroscopic Ellipsometry
2007 ◽
Vol 305
(1)
◽
pp. 113-121
◽
Keyword(s):
2014 ◽
Vol 53
(4S)
◽
pp. 04EH02
◽
Keyword(s):
2005 ◽
Vol 8
(1-3)
◽
pp. 97-101
◽
Keyword(s):