Reverse Bias Life Test Stability of Tantalum‐Titanium Anodic Oxide Thin Film Capacitors

1977 ◽  
Vol 124 (6) ◽  
pp. 949-951 ◽  
Author(s):  
F. G. Peters ◽  
N. Schwartz
Keyword(s):  
Thin Film ◽  
Reverse Bias ◽  
Anodic Oxide ◽  
Oxide Thin Film ◽  
Life Test ◽  
Thin Film Capacitors

Breakdown in titanium oxide thin film capacitors

1985 ◽  
Vol 4 (3) ◽  
pp. 313-314 ◽  
Author(s):  
Bellan Babuji ◽  
C. Balasubramanian ◽  
M. Radhakrishnan
Keyword(s):  
Thin Film ◽  
Titanium Oxide ◽  
Oxide Thin Film ◽  
Thin Film Capacitors

Light modulation of nanostructured alumina anodic oxide thin film on sapphire

2011 ◽  
Vol 6 (7) ◽  
pp. 515 ◽  
Author(s):  
Hsinwha Liu ◽  
Je-Chuang Wang ◽  
Chen Hsu
Keyword(s):  
Thin Film ◽  
Anodic Oxide ◽  
Oxide Thin Film ◽  
Light Modulation

Influence of Schottky Interfaces on Dielectric Properties in Perovskite-Type Oxide Thin-Film Capacitors

2011 ◽  
Vol 485 ◽  
pp. 203-206
Author(s):  
Naohiro Horiuchi ◽  
Takuya Hoshina ◽  
Hiroaki Takeda ◽  
Takaaki Tsurumi
Keyword(s):  
Thin Film ◽  
Estimation Method ◽  
Hysteretic Behavior ◽  
Perovskite Oxide ◽  
Oxide Thin Film ◽  
Perovskite Type Oxide ◽  
Thin Film Capacitors ◽  
Capacitance Voltage ◽  
Perovskite Type ◽  
Schottky Model

An estimation method of the influence of interfaces on properties in perovskite-type oxide thin-film capacitors is presented. We proposed a modified Schottky model that can be employed to explain the electric properties of metal/perovskite-type oxide junctions. The modified model considers the electric field dependence of permittivity and the flow of electrons from metal to defect states located in the band gap of the perovskite oxide. The simulation based on this model could successfully describe the results of capacitance-voltage measurements of junctions between metals (Pt, Au, and Ag) and Nb-doped SrTiO3, which were not explained by the conventional Schottky model. Additionally, a simulation for a thin-film capacitor with hysteretic behavior could depict an asymmetric capacitance-voltage curve.

Dielectric and electrical studies on Samarium Oxide thin film capacitors

1984 ◽  
Vol 19 (9) ◽  
pp. 1245-1250 ◽  
Author(s):  
M. Chandra Shekab ◽  
J. Siva Kumar ◽  
U. V. Subba Rao ◽  
V. Hari Babu
Keyword(s):  
Thin Film ◽  
Oxide Thin Film ◽  
Samarium Oxide ◽  
Electrical Studies ◽  
Thin Film Capacitors
Sign in / Sign up

Export Citation Format

Share Document