Accurate Determination of Shallow Zn‐Diffusion Profiles in GaP and GaAs0.1 P 0.9 Using Anodic Oxidation and a Double Radioactive Tracer Technique

1977 ◽  
Vol 124 (3) ◽  
pp. 469-471 ◽  
Author(s):  
J. C. Verplanke
Keyword(s):  
Anodic Oxidation ◽  
Accurate Determination ◽  
Radioactive Tracer ◽  
Tracer Technique ◽  
Radioactive Tracer Technique ◽  
Zn Diffusion ◽  
Diffusion Profiles

The angular distribution of scattered and sputtered 40-keV particles on polycrystalline targets

1968 ◽  
Vol 46 (6) ◽  
pp. 753-758 ◽  
Author(s):  
E. Formann ◽  
F. P. Viehböck ◽  
H. Wotke
Keyword(s):  
Angular Distribution ◽  
Activation Analysis ◽  
Hard Sphere ◽  
Ion Beam ◽  
Radioactive Tracer ◽  
Angular Distributions ◽  
Tracer Technique ◽  
Potential Approximation ◽  
Radioactive Tracer Technique ◽  
Graphite Rods

Based on the hard-sphere potential approximation, angular distributions of scattered particles at different mass ratios M1:M2 were calculated. The results were compared with experiments carried out with the following atoms:[Formula: see text]The sputtered particles from the target as well as from the incident-ion beam were collected on graphite rods and measured by either activation analysis or a radioactive tracer technique.

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