The Current‐Voltage Characteristics of MOS Structures as Measured with Triangular and Sinusoidal Voltage Sweep Methods
1984 ◽
Vol 131
(1)
◽
pp. 220-222
◽
Keyword(s):
Keyword(s):
Keyword(s):
2006 ◽
Vol 50
(9-10)
◽
pp. 1532-1539
◽
1979 ◽
Vol 40
(C7)
◽
pp. C7-491-C7-492
1980 ◽
Vol 41
(C6)
◽
pp. C6-398-C6-400
◽
1982 ◽
Vol 43
(C1)
◽
pp. C1-165-C1-170