Scanning Electrochemical Microscopy: The Application of the Feedback Mode for High Resolution Copper Etching

1989 ◽  
Vol 136 (10) ◽  
pp. 3143-3144 ◽  
Author(s):  
Daniel Mandler ◽  
Allen J. Bard
Keyword(s):  
High Resolution ◽  
Scanning Electrochemical Microscopy ◽  
Feedback Mode ◽  
Electrochemical Microscopy

Nanoscale mapping of catalytic hotspots on Fe, N-modified HOPG by scanning electrochemical microscopy-atomic force microscopy

Nanoscale ◽  
2018 ◽  
Vol 10 (15) ◽  
pp. 6962-6970 ◽  
Author(s):  
Srikanth Kolagatla ◽  
Palaniappan Subramanian ◽  
Alex Schechter
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
High Resolution ◽  
Scanning Electrochemical Microscopy ◽  
Graphitic Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemical Microscopy

The scanning electrochemical microscopy-atomic force microscopy (SECM-AFM) technique is used to map catalytic currents post Fe and N surface modification of graphitic carbon with an ultra-high resolution of 50 nm.

A Leveling Method Based on Current Feedback Mode of Scanning Electrochemical Microscopy

2013 ◽  
Vol 85 (3) ◽  
pp. 1322-1326 ◽  
Author(s):  
Lianhuan Han ◽  
Ye Yuan ◽  
Jie Zhang ◽  
Xuesen Zhao ◽  
Yongzhi Cao ◽  
...  
Keyword(s):  
Scanning Electrochemical Microscopy ◽  
Current Feedback ◽  
Feedback Mode ◽  
Electrochemical Microscopy

Characterization of Microfabricated Probes for Combined Atomic Force and High-Resolution Scanning Electrochemical Microscopy

2006 ◽  
Vol 78 (15) ◽  
pp. 5436-5442 ◽  
Author(s):  
Maurizio R. Gullo ◽  
Patrick L. T. M. Frederix ◽  
Terunobu Akiyama ◽  
Andreas Engel ◽  
Nico F. deRooij ◽  
...  
Keyword(s):  
High Resolution ◽  
Scanning Electrochemical Microscopy ◽  
Atomic Force ◽  
Electrochemical Microscopy

Nanowire Probes for High Resolution Combined Scanning Electrochemical Microscopy − Atomic Force Microscopy

Nano Letters ◽  
2005 ◽  
Vol 5 (4) ◽  
pp. 639-643 ◽  
Author(s):  
David P. Burt ◽  
Neil R. Wilson ◽  
John M. R. Weaver ◽  
Phillip S. Dobson ◽  
Julie V. Macpherson
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Scanning Electrochemical Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemical Microscopy
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