The Effect of Temperature on Electron Capture Cross Sections and Densities in Irradiated [ 2.4 Mrads ( SiO2 ) ] IGFETs
1995 ◽
Vol 142
(6)
◽
pp. 2007-2013
◽
Keyword(s):
Keyword(s):
1985 ◽
Vol 18
(21)
◽
pp. 4283-4293
◽
Keyword(s):
Keyword(s):
1995 ◽
Vol 98
(1-4)
◽
pp. 190-194
Keyword(s):