The Effect of the Thermal History of Czochralski Silicon Crystals on the Defect Generation and Refresh Time Degradation in High Density Memory Devices
1995 ◽
Vol 142
(2)
◽
pp. 553-559
◽
Keyword(s):
2000 ◽
Vol 73
(1-3)
◽
pp. 158-162
◽
1985 ◽
Vol 24
(Part 1, No. 12)
◽
pp. 1594-1599
◽
1984 ◽
Vol 49
(3)
◽
pp. 559-569
◽
Keyword(s):
2001 ◽
Vol 119
(3)
◽
pp. 117-119
◽