Development and Characterization of Electrochemical Devices Using Ultraviolet Laser Induced Carbonization of Polyimide Films

1997 ◽  
Vol 144 (11) ◽  
pp. 3769-3772 ◽  
Author(s):  
Gary H. Wynn ◽  
Augustus W. Fountain
1981 ◽  
pp. 7-22 ◽  
Author(s):  
T. L. Wohlford ◽  
J. Schaff ◽  
L. T. Taylor ◽  
T. A. Furtsch ◽  
E. Khor ◽  
...  

Electronics ◽  
2021 ◽  
Vol 10 (22) ◽  
pp. 2745
Author(s):  
Alessandro Soldati ◽  
Matteo Dalboni ◽  
Roberto Menozzi ◽  
Carlo Concari

The on-state voltage of MOSFETs is a convenient and powerful temperature-sensitive electric parameter (TSEP) to determine the junction temperature, thus enabling device monitoring, protection, diagnostics and prognostics. The main hurdle in the use of the on-state voltage as a TSEP is the per-device characterization procedure, to be carried out in a controlled environment, with high costs. In this paper, we compare two novel techniques for MOSFET junction temperature estimation: controlled shoot-through and direct heating by resistive heaters embedded in two Kapton (polyimide) films. Both allow in-place characterization of the TSEP curve with the device mounted in its final circuit and assembly, including the working heat sink. The two methods are also validated against the conventional procedure in a thermal chamber.


2014 ◽  
Vol 20 (05) ◽  
pp. 1 ◽  
Author(s):  
Tatiana Alexandru ◽  
Angela Staicu ◽  
Alexandru I. Pascu ◽  
Elena Radu ◽  
Alexandru Stoicu ◽  
...  

1996 ◽  
Vol 25 (3) ◽  
pp. 549-551 ◽  
Author(s):  
Z. Kocsis ◽  
Z. S. Kincses ◽  
B. Hopp ◽  
G. Ripka ◽  
I. Mojzes

1990 ◽  
Vol 2 (6) ◽  
pp. 640-641 ◽  
Author(s):  
J. J. Bergmeister ◽  
J. D. Rancourt ◽  
L. T. Taylor

Sign in / Sign up

Export Citation Format

Share Document