Characterization of Microstructure, Interfacial Reaction and Diffusion of Immiscible Cu(Ta) Alloy Thin Film on SiO[sub 2] at Elevated Temperature
2004 ◽
Vol 151
(1)
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pp. G18
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Keyword(s):
2007 ◽
Vol 138
(2)
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pp. 329-334
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2002 ◽
Vol 20
(6)
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pp. 2361
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2008 ◽
Vol 465
(1-2)
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pp. 458-461
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Keyword(s):
2005 ◽
Vol 52
(10)
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pp. 983-987
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2003 ◽
Vol 13
(2)
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pp. 330-336
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Keyword(s):