Dilute CH[sub 3]SH Sensing Characteristics of CdGa[sub 2]O[sub 4] Thick Film Prepared by Sol-Gel Method

2002 ◽  
Vol 5 (2) ◽  
pp. H4 ◽  
Author(s):  
Xiangfeng Chu ◽  
Jun Tamaki
2013 ◽  
Vol 743 ◽  
pp. 253-256
Author(s):  
Yin Lin Wu ◽  
Hai Yan Zhao ◽  
Qing Hui Wang ◽  
Ling Wang

Electrochemical sensors based on tubular yttria-stabilized zerconia (YSZ) with the spinel-type oxide as a sensing-electrode (SE), which is prepared by sol-gel method, were fabricated and examined for NO2 detection in the temperature range 450~500°C. The results show that ZnFe2O4, shows extreme sensitivity to NO2. The EMF varies linearly as a function of the concentration of NO2 (0 ~ 463 ppm) at 500 °C.


2017 ◽  
Vol 393 ◽  
pp. 134-143 ◽  
Author(s):  
Ensi Cao ◽  
Yuqing Yang ◽  
Tingting Cui ◽  
Yongjia Zhang ◽  
Wentao Hao ◽  
...  

2013 ◽  
Vol 339 ◽  
pp. 109-113
Author(s):  
Yin Lin Wu ◽  
Hai Yan Zhao ◽  
Ling Wang

Electrochemical sensors based on tubular yttria-stabilized zerconia (YSZ) with the perovskite-type oxide as a sensing-electrode (SE), which is prepared by sol-gel method, were fabricated and examined for NO2 detection in the temperature range 400~700°C. The results show that La0.75Sr0.25Cr0.5Mn0.5O3(LSCM), shows extreme sensitivity to NO2. The EMF varies linearly as a function of the concentration of NO2 (0 ~ 463 ppm) at 500 °C.


2001 ◽  
Vol 80 (1) ◽  
pp. 28-32 ◽  
Author(s):  
Tetsuya Kida ◽  
Yuji Miyachi ◽  
Kengo Shimanoe ◽  
Noboru Yamazoe

2013 ◽  
Vol 562-565 ◽  
pp. 952-957 ◽  
Author(s):  
Wei Ren ◽  
Xiu Chen Zhao ◽  
Jun Hong Li

As a key MEMS transducer materials, PbZr0.52Ti0.48O3(PZT) piezoelectric thick film should have good piezoelectric properties as well as lower stress. But now few studies on PZT film stress were carried out. The PZT thick films are deposited by a modified sol-gel method, and the influences of crystallization temperature and slurry concentration on stress are investigated in this paper. The result shows that the PZT thick film stress is tensile stress about 100-1000Mpa. With crystallization temperature increasing, thermal stress increases gradually. The stress increases about 3.5 times as the crystallization temperature rises from 600°C to 700°C. With powder concentration of slurry increasing, the stress of PZT thick film becomes smaller. The stress decreases about 7 times as powder concentration of slurry increasing from 1:4.5 to 1:3.5. The relationship between stress of PZT thick films and crystallization temperature is simulated by using the finite element method, and the results of simulation agree well with the experimental results.


2003 ◽  
Vol 94 (2) ◽  
pp. 216-221 ◽  
Author(s):  
Zheng Jiao ◽  
Minghong Wu ◽  
Jianzhong Gu ◽  
Xilian Sun

RSC Advances ◽  
2015 ◽  
Vol 5 (13) ◽  
pp. 9884-9890 ◽  
Author(s):  
Ying Wang ◽  
Ying Lin ◽  
Dingsheng Jiang ◽  
Feng Li ◽  
Chao Li ◽  
...  

A Au@In2O3 core–shell nanostructure was prepared via a sol–gel method firstly. The Au@In2O3 sensor showed rapid response and perfect selectivity to ethanol.


Sign in / Sign up

Export Citation Format

Share Document