Structural Characterization of Layered LiMnO2 Electrodes by Electron Diffraction and Lattice Imaging

1999 ◽  
Vol 146 (7) ◽  
pp. 2404-2412 ◽  
Author(s):  
Y. Shao‐Horn ◽  
S. A. Hackney ◽  
A. R. Armstrong ◽  
P. G. Bruce ◽  
R. Gitzendanner ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Structural Characterization ◽  
Lattice Imaging ◽  
Layered Limno2

Synthesis and structure refinement of a new type of layered intergrowth phase: Sb3+x Nb3−x TiO14 and Sb3+x Ta3−x TiO14

1996 ◽  
Vol 52 (6) ◽  
pp. 932-938 ◽  
Author(s):  
C. D. Ling ◽  
S. Schmid ◽  
J. G. Thompson ◽  
R. L. Withers ◽  
M. Sterns
Keyword(s):  
Electron Diffraction ◽  
Structural Characterization ◽  
Structure Refinement ◽  
Aurivillius Phase ◽  
New Type

Attempts to synthesize Sb-based analogues of the known Bi-based Aurivillius phase, Bi3TiNbO9, have led to the discovery of an isomorphous pair of a new type of layered intergrowth phase of general stoichiometry Sb3+x Nb3−x TiO14 and Sb3+x Ta3−x TiO14. Electron diffraction proved essential for the initial recognition and structural characterization of these phases. The structures of Sb3+x Nb3−x TiO14, x = 0.89, and Sb3+x Ta3−x TiO14, x = 1.26, are reported. The structures are described as ordered intergrowths of β-Sb2O4-type and Sb2O5-type structures, with NbV/TaV substituting for SbV in the former and NbV/TaV/TiIV substituting for SbV in the latter.

Characterization of Long Period Polytypoid Structures in The Al2O3-AlN System

1985 ◽  
Vol 60 ◽  
Author(s):  
Kannan M. Krishnan ◽  
R.S. Rai ◽  
G. Thomas ◽  
N.D. Corbin ◽  
J.W. McCauley
Keyword(s):  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Sintering Process ◽  
Lattice Imaging ◽  
Beam Electron ◽  
Long Period ◽  
Convergent Beam

AbstractLong period polytypoid structures observed along the pseudobinary Al2O3-AlN composition join at a composition of 95 mol% A1N have been investigated by convergent beam electron diffraction and lattice imaging. Two new long period structures, 32H (Ramsdell notation) and 16H with c-periodicities of 8.3 nm and 4.07 nm respectively, have been independently identified by these two techniques. However, the 32H polytypoid was sometimes found to be intergrown with faulted 27R long period structure of periodicity 7.2 nm. Further, it has been shown that the 32H polytypoid is stabilized by local compositional fluctuations during the sintering process.

Structural Characterization of Organics Using Manual and Automated Electron Diffraction

2010 ◽  
Vol 50 (3) ◽  
pp. 385-409 ◽  
Author(s):  
Ute Kolb ◽  
Tatiana E. Gorelik ◽  
Enrico Mugnaioli ◽  
Andrew Stewart
Keyword(s):  
Electron Diffraction ◽  
Structural Characterization
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