Facet‐Free Selective Silicon Epitaxy by Reduced‐Pressure Chemical Vapor Deposition Process Evaluation and Impact on Shallow Trench Isolation
1999 ◽
Vol 146
(5)
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pp. 1895-1902
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2002 ◽
Vol 89
(1-3)
◽
pp. 314-318
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Keyword(s):
1987 ◽
Vol 5
(6)
◽
pp. 1551
◽
1986 ◽
Vol 133
(8)
◽
pp. 1701-1705
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Keyword(s):