Angle-Resolved Photoelectron Spectroscopy Studies of Initial Stage of Thermal Oxidation on 4H-SiC (0001) on-Axis and 4° Off-Axis Substrates

Hitoshi Arai; Ryoma Toyoda; Ai Ishohashi; Yasuhisa Sano; Hiroshi Nohira

doi:10.1149/07706.0051ecst

Angle-Resolved Photoelectron Spectroscopy Studies of Initial Stage of Thermal Oxidation on 4H-SiC (0001) on-Axis and 4° Off-Axis Substrates

ECS Transactions ◽

10.1149/07706.0051ecst ◽

2017 ◽

Vol 77 (6) ◽

pp. 51-57

Author(s):

Hitoshi Arai ◽

Ryoma Toyoda ◽

Ai Ishohashi ◽

Yasuhisa Sano ◽

Hiroshi Nohira

Keyword(s):

Thermal Oxidation ◽

Photoelectron Spectroscopy ◽

Initial Stage ◽

Spectroscopy Studies

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Angle-Resolved Photoelectron Spectroscopy Studies of Initial Stage of Thermal Oxidation on 4H-SiC (0001) on-Axis and 4° Off-Axis Substrates

ECS Meeting Abstracts ◽

10.1149/ma2017-01/27/1291 ◽

2017 ◽

Keyword(s):

Thermal Oxidation ◽

Photoelectron Spectroscopy ◽

Initial Stage ◽

Spectroscopy Studies

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Angle-resolved Photoelectron Spectroscopy Studies of Initial Stage of Thermal Oxidation on 4H-SiC (0001)

10.7567/ssdm.2015.ps-1-18 ◽

2015 ◽

Author(s):

H. Arai ◽

H. Nohira

Keyword(s):

Thermal Oxidation ◽

Photoelectron Spectroscopy ◽

Initial Stage ◽

Spectroscopy Studies

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Angle-Resolved Photoelectron Spectroscopy Studies of Initial Stage of Oxidation on C-Face 4H-SiC

ECS Transactions ◽

10.1149/06407.0245ecst ◽

2014 ◽

Vol 64 (7) ◽

pp. 245-252 ◽

Cited By ~ 1

Author(s):

T. Sasago ◽

S. Yamahori ◽

H. Nohira

Keyword(s):

Photoelectron Spectroscopy ◽

Initial Stage ◽

Spectroscopy Studies

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Angle-Resolved Photoelectron Spectroscopy Studies of Initial Stage of Oxidation on C-Face 4H-SiC

ECS Meeting Abstracts ◽

10.1149/ma2014-02/40/1987 ◽

2014 ◽

Keyword(s):

Photoelectron Spectroscopy ◽

Initial Stage ◽

Spectroscopy Studies

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Angle-resolved photoelectron spectroscopy study of initial stage of thermal oxidation on 4H-SiC(0001)

Japanese Journal of Applied Physics ◽

10.7567/jjap.55.04eb04 ◽

2016 ◽

Vol 55 (4S) ◽

pp. 04EB04 ◽

Cited By ~ 1

Author(s):

Hitoshi Arai ◽

Hiroshi Nohira

Keyword(s):

Thermal Oxidation ◽

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

Initial Stage

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Atomic force microscopy and x-ray photoelectron spectroscopy studies of ZnO nanoparticles on SiO2 fabricated by ion implantation and thermal oxidation

Applied Physics Letters ◽

10.1063/1.2221507 ◽

2006 ◽

Vol 89 (2) ◽

pp. 023115 ◽

Cited By ~ 19

Author(s):

H. Amekura ◽

O. A. Plaksin ◽

M. Yoshitake ◽

Y. Takeda ◽

N. Kishimoto ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Ion Implantation ◽

Thermal Oxidation ◽

Zno Nanoparticles ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Force Microscopy ◽

Atomic Force ◽

Spectroscopy Studies

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Initial stage of copper thermal oxidation studied by UV-vis-NIR reflectance spectroscopy, XPS and X-ray diffraction

Materials Research Bulletin ◽

10.1016/0025-5408(88)90262-0 ◽

1988 ◽

Vol 23 (10) ◽

pp. 1379-1388 ◽

Cited By ~ 10

Author(s):

J.M. Machefert ◽

A. D'Huysser ◽

M. Lenglet ◽

J. Lopitaux ◽

D. Delahaye

Keyword(s):

Thermal Oxidation ◽

Reflectance Spectroscopy ◽

X Ray Diffraction ◽

X Ray ◽

Initial Stage ◽

Nir Reflectance Spectroscopy

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X-ray photoelectron spectroscopy studies of the evaporated aluminum/corona-treated polyethylene terephthalate interface

Applied Surface Science ◽

10.1016/s0169-4332(98)00302-x ◽

1998 ◽

Vol 135 (1-4) ◽

pp. 339-349 ◽

Cited By ~ 33

Author(s):

L Sandrin ◽

E Sacher

Keyword(s):

Polyethylene Terephthalate ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Spectroscopy Studies

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X-ray diffraction spectroscopy and X-ray photoelectron spectroscopy studies of Cu-doped ZnO films

Physica E Low-dimensional Systems and Nanostructures ◽

10.1016/j.physe.2008.12.017 ◽

2009 ◽

Vol 41 (5) ◽

pp. 788-791 ◽

Cited By ~ 36

Author(s):

H. Xue ◽

Y. Chen ◽

X.L. Xu ◽

G.H. Zhang ◽

H. Zhang ◽

...

Keyword(s):

Photoelectron Spectroscopy ◽

Zno Films ◽

X Ray Diffraction ◽

X Ray ◽

Doped Zno ◽

Spectroscopy Studies

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X-ray photoelectron spectroscopy studies the cation valencies and distributions in crednerite-Cu1.1Mn0.9O2 thin films

Journal of Alloys and Compounds ◽

10.1016/j.jallcom.2014.02.018 ◽

2014 ◽

Vol 598 ◽

pp. 23-26 ◽

Cited By ~ 12

Author(s):

Hong-Ying Chen ◽

Da-Je Hsu

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Spectroscopy Studies

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