Investigation of HfAlO Trapping Layer with Various Al Contents by Variable Temperature Kelvin Probe Force Microscopy

2014 ◽  
Vol 60 (1) ◽  
pp. 27-32 ◽  
Author(s):  
D. Zhang ◽  
Z. Huo ◽  
L. Jin ◽  
Y. Han ◽  
G. Chen ◽  
...  
Keyword(s):  
Variable Temperature ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

Investigation of charge loss mechanism of thickness-scalable trapping layer by variable temperature Kelvin probe force microscopy

2013 ◽  
Vol 34 (7) ◽  
pp. 870-872 ◽  
Author(s):  
Yulong Han ◽  
Zongliang Huo ◽  
Xinkai Li ◽  
Guoxing Chen ◽  
Xiaonan Yang ◽  
...  
Keyword(s):  
Variable Temperature ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Loss Mechanism ◽  
Force Microscopy ◽  
Charge Loss

Identifying DNA mismatches at single-nucleotide resolution by probing individual surface potentials of DNA-capped nanoparticles

Nanoscale ◽  
2018 ◽  
Vol 10 (2) ◽  
pp. 538-547 ◽  
Author(s):  
Hyungbeen Lee ◽  
Sang Won Lee ◽  
Gyudo Lee ◽  
Wonseok Lee ◽  
Kihwan Nam ◽  
...  
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Powerful Method ◽  
Kelvin Probe ◽  
Single Nucleotide ◽  
Force Microscopy ◽  
Surface Potentials ◽  
Dna Mismatches ◽  
Nucleotide Resolution ◽  
Single Nucleotide Resolution

Here, we demonstrate a powerful method to discriminate DNA mismatches at single-nucleotide resolution from 0 to 5 mismatches (χ0 to χ5) using Kelvin probe force microscopy (KPFM).

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