Investigation of Redox Kinetics by Simultaneous In Situ Optical Absorption Relaxation and Electrode Impedance Measurements: Pr Doped Ceria Thin Films

2013 ◽  
Vol 57 (1) ◽  
pp. 1979-1984 ◽  
Author(s):  
J. J. Kim ◽  
S. R. Bishop ◽  
N. J. Thompson ◽  
H. L. Tuller
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Electrode Impedance ◽  
Doped Ceria ◽  
Impedance Measurements ◽  
Redox Kinetics

Defect Chemistry of Pr Doped Ceria Thin Films Investigated by in Situ Optical and Impedance Measurements

2017 ◽  
Vol 29 (5) ◽  
pp. 1999-2007 ◽  
Author(s):  
Jae Jin Kim ◽  
Sean R. Bishop ◽  
Di Chen ◽  
Harry L. Tuller
Keyword(s):  
Thin Films ◽  
Defect Chemistry ◽  
Doped Ceria ◽  
Impedance Measurements

Optical absorption and redox kinetics of YBa2Cu3O7−δ thin films studied by optical in-situ spectroscopy

2018 ◽  
Vol 315 ◽  
pp. 98-101 ◽  
Author(s):  
Jianmin Shi ◽  
Michael Martens ◽  
Frank Ludwig ◽  
Klaus Dilger ◽  
Klaus-Dieter Becker
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
In Situ Spectroscopy ◽  
Redox Kinetics ◽  
Kinetics Of

In situ monitoring the role of citrate in chemical bath deposition of PbS thin films

CrystEngComm ◽  
2016 ◽  
Vol 18 (1) ◽  
pp. 149-156 ◽  
Author(s):  
Sucheta Sengupta ◽  
Maayan Perez ◽  
Alexander Rabkin ◽  
Yuval Golan
Keyword(s):  
Thin Films ◽  
Light Scattering ◽  
Optical Absorption ◽  
Chemical Bath Deposition ◽  
Trisodium Citrate ◽  
In Situ Monitoring ◽  
Cluster Mechanism ◽  
Absorption Measurements

We report the formation of size tunable PbS nanocubes induced by the presence of trisodium citrate during growth of PbS thin films by chemical bath deposition. The presence of citrate induces growth by the cluster mechanism which is monitored by XRD and HRSEM, along with real time light scattering and optical absorption measurements.

Surface impedance measurements on coevaporated in situ grown YBa2Cu3O7 − δ thin films at 87 GHz

1990 ◽  
Vol 164-165 ◽  
pp. 1261-1268 ◽  
Author(s):  
S. Orbach ◽  
N. Klein ◽  
G. Müller ◽  
H. Piel ◽  
P. Berberich ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Impedance ◽  
Impedance Measurements

The superconducting gap of in situ MgB2 thin films by microwave surface impedance measurements

2002 ◽  
Vol 81 (19) ◽  
pp. 3603-3605 ◽  
Author(s):  
N. Hakim ◽  
C. Kusko ◽  
S. Sridhar ◽  
A. Soukiassian ◽  
X. H. Zeng ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Impedance ◽  
Superconducting Gap ◽  
Impedance Measurements ◽  
Microwave Surface Impedance ◽  
Mgb2 Thin Films

Role of grain size on redox induced compositional stresses in Pr doped ceria thin films

2017 ◽  
Vol 19 (19) ◽  
pp. 12206-12220 ◽  
Author(s):  
Jay Sheth ◽  
Di Chen ◽  
Harry L. Tuller ◽  
Scott T. Misture ◽  
Sean R. Bishop ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Size Dependence ◽  
Stress And Strain ◽  
Doped Ceria ◽  
X Ray Diffraction ◽  
X Ray ◽  
Compositional Stresses

In-situ wafer curvature and x-ray diffraction measurements were employed to investigate the grain size dependence of stress and strain in Pr doped ceria thin films.

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