Using a constraint satisfaction formulation and solution techniques for random test program generation

E. Bin; R. Emek; G. Shurek; A. Ziv

doi:10.1147/sj.413.0386

Using a constraint satisfaction formulation and solution techniques for random test program generation

IBM Systems Journal ◽

10.1147/sj.413.0386 ◽

2002 ◽

Vol 41 (3) ◽

pp. 386-402 ◽

Cited By ~ 62

Author(s):

E. Bin ◽

R. Emek ◽

G. Shurek ◽

A. Ziv

Keyword(s):

Constraint Satisfaction ◽

Test Program ◽

Random Test ◽

Program Generation ◽

Solution Techniques

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Weighted random test program generation for a per-pin tester

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114122 ◽

2002 ◽

Author(s):

J. Gartner ◽

B. Driscoll ◽

D. Forlenza ◽

O. Forlenza ◽

T. Koprowski ◽

...

Keyword(s):

Test Program ◽

Random Test ◽

Program Generation

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MicroTESK: A Tool for Constrained Random Test Program Generation for Microprocessors

Lecture Notes in Computer Science - Perspectives of System Informatics ◽

10.1007/978-3-319-74313-4_28 ◽

2018 ◽

pp. 387-393

Author(s):

Alexander Kamkin ◽

Andrei Tatarnikov

Keyword(s):

Test Program ◽

Random Test ◽

Program Generation

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Random test program generation for verification and validation of the Samsung Reconfigurable Processor

Journal of Systems Architecture ◽

10.1016/j.sysarc.2019.05.007 ◽

2019 ◽

Vol 97 ◽

pp. 219-238 ◽

Cited By ~ 1

Author(s):

Bernhard Egger ◽

Eunjin Song ◽

Hochan Lee ◽

Daeyong Shin

Keyword(s):

Verification And Validation ◽

Test Program ◽

Reconfigurable Processor ◽

Random Test ◽

Program Generation

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Constraint satisfaction for test program generation

Proceedings International Phoenix Conference on Computers and Communications ◽

10.1109/pccc.1995.472513 ◽

2002 ◽

Cited By ~ 10

Author(s):

D. Lewin ◽

L. Fournier ◽

M. Levinger ◽

E. Roytman ◽

G. Shurek

Keyword(s):

Constraint Satisfaction ◽

Test Program ◽

Program Generation

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A Probabilistic Context-Free Grammar Based Random Test Program Generation

2017 Euromicro Conference on Digital System Design (DSD) ◽

10.1109/dsd.2017.26 ◽

2017 ◽

Author(s):

Ondrej Cekan ◽

Zdenek Kotasek

Keyword(s):

Test Program ◽

Context Free Grammar ◽

Random Test ◽

Program Generation ◽

Context Free ◽

Probabilistic Context

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On automatic software-based self-test program generation based on high-level decision diagrams

2016 17th Latin-American Test Symposium (LATS) ◽

10.1109/latw.2016.7483357 ◽

2016 ◽

Cited By ~ 3

Author(s):

Artjom Jasnetski ◽

Raimund Ubar ◽

Anton Tsertov

Keyword(s):

Decision Diagrams ◽

Test Program ◽

Program Generation ◽

Automatic Software ◽

Self Test ◽

High Level

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Reinforcement-Learning-Based Test Program Generation for Software-Based Self-Test

2019 IEEE 28th Asian Test Symposium (ATS) ◽

10.1109/ats47505.2019.00013 ◽

2019 ◽

Author(s):

Ching-Yuan Chen ◽

Jiun-Lang Huang

Keyword(s):

Reinforcement Learning ◽

Test Program ◽

Program Generation ◽

Self Test

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Automatic test program generation for a block oriented VLSI chip design

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36222 ◽

2003 ◽

Cited By ~ 2

Author(s):

F. Hapke

Keyword(s):

Automatic Test ◽

Test Program ◽

Chip Design ◽

Program Generation ◽

Vlsi Chip

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Optimization of access points for automatic test program generation and fault location in large analogue circuits and systems

Microelectronics Reliability ◽

10.1016/s0026-2714(82)80245-x ◽

1982 ◽

Vol 22 (4) ◽

pp. 899-900

Keyword(s):

Fault Location ◽

Automatic Test ◽

Test Program ◽

Access Points ◽

Program Generation ◽

Analogue Circuits

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Random testing of C compilers based on test program generation by equivalence transformation

2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) ◽

10.1109/apccas.2016.7804063 ◽

2016 ◽

Cited By ~ 4

Author(s):

Kazuhiro Nakamura ◽

Nagisa Ishiura

Keyword(s):

Equivalence Transformation ◽

Random Testing ◽

Test Program ◽

Program Generation

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