Computer Simulation of High-Resolution Electron Micrographs Using Dynamical Electron Scattering

William Krakow

doi:10.1147/rd.251.0058

Computer Simulation of High-Resolution Electron Micrographs Using Dynamical Electron Scattering

IBM Journal of Research and Development ◽

10.1147/rd.251.0058 ◽

1981 ◽

Vol 25 (1) ◽

pp. 58-70 ◽

Cited By ~ 18

Author(s):

William Krakow

Keyword(s):

Computer Simulation ◽

High Resolution ◽

Electron Micrographs ◽

Electron Scattering ◽

Resolution Electron ◽

High Resolution Electron Micrographs

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Adaptive fourier-filtering technique for quantitative evaluation of high-resolution electron micrographs of interfaces

Ultramicroscopy ◽

10.1016/0304-3991(93)90212-g ◽

1993 ◽

Vol 49 (1-4) ◽

pp. 46-65 ◽

Cited By ~ 42

Author(s):

G. Möbus ◽

G. Necker ◽

M. Rühle

Keyword(s):

High Resolution ◽

Quantitative Evaluation ◽

Electron Micrographs ◽

Resolution Electron ◽

Fourier Filtering ◽

Filtering Technique ◽

High Resolution Electron Micrographs

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A digital processing method for structural analysis of atom clusters from high resolution electron micrographs

Micron (1969) ◽

10.1016/0047-7206(83)90014-6 ◽

1983 ◽

Vol 14 (2) ◽

pp. 119-134

Author(s):

Koichi Kanaya ◽

Kengo Takamiya ◽

Masayuki Shino ◽

Chiharu Shinohara

Keyword(s):

Structural Analysis ◽

High Resolution ◽

Electron Micrographs ◽

Digital Processing ◽

Processing Method ◽

Atom Clusters ◽

Resolution Electron ◽

High Resolution Electron Micrographs

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Composition analysis of coherent nanoinsertions of solid solutions on the basis of high-resolution electron micrographs

Semiconductors ◽

10.1134/1.1356160 ◽

2001 ◽

Vol 35 (3) ◽

pp. 347-352 ◽

Cited By ~ 8

Author(s):

I. P. Soshnikov ◽

O. M. Gorbenko ◽

A. O. Golubok ◽

N. N. Ledentsov

Keyword(s):

High Resolution ◽

Electron Micrographs ◽

Solid Solutions ◽

Composition Analysis ◽

Resolution Electron ◽

High Resolution Electron Micrographs

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The structures of some complex oxides containing niobium from high-resolution electron micrographs

Acta Crystallographica Section A Foundations of Crystallography ◽

10.1107/s0108767384088565 ◽

1984 ◽

Vol 40 (a1) ◽

pp. C390-C391

Author(s):

M. Sundberg

Keyword(s):

High Resolution ◽

Electron Micrographs ◽

Complex Oxides ◽

Resolution Electron ◽

High Resolution Electron Micrographs

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Processing Of Noisy High Resolution Electron Micrographs Of Crystalline Biological Membranes

10.1117/12.965970 ◽

1983 ◽

Author(s):

Suzanne B. Luscher

Keyword(s):

High Resolution ◽

Electron Micrographs ◽

Biological Membranes ◽

Resolution Electron ◽

High Resolution Electron Micrographs

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Analysis of power spectra of high resolution electron micrographs

Ultramicroscopy ◽

10.1016/0304-3991(93)90187-3 ◽

1993 ◽

Vol 52 (2) ◽

pp. 167-178

Author(s):

G.R. Anstis ◽

G.J. Auchterlonie ◽

J.C. Barry

Keyword(s):

High Resolution ◽

Electron Micrographs ◽

Power Spectra ◽

Resolution Electron ◽

High Resolution Electron Micrographs

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High-speed computation techniques for the simulation of high resolution electron micrographs

Journal of Microscopy ◽

10.1111/j.1365-2818.1983.tb04706.x ◽

1983 ◽

Vol 132 (1) ◽

pp. 31-42 ◽

Cited By ~ 33

Author(s):

D. Van Dyck

Keyword(s):

High Resolution ◽

Electron Micrographs ◽

High Speed ◽

Computation Techniques ◽

Resolution Electron ◽

High Resolution Electron Micrographs

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Auto-correlation analysis of high resolution electron micrographs of near-amorphous thin films

Ultramicroscopy ◽

10.1016/0304-3991(85)90201-3 ◽

1985 ◽

Vol 17 (4) ◽

pp. 345-355 ◽

Cited By ~ 75

Author(s):

G.Y. Fan ◽

J.M. Cowley

Keyword(s):

Thin Films ◽

High Resolution ◽

Correlation Analysis ◽

Electron Micrographs ◽

Amorphous Thin Films ◽

Auto Correlation ◽

Resolution Electron ◽

High Resolution Electron Micrographs

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High Resolution Electron Micrographs of Thin Tissue Sections

Nature ◽

10.1038/173309a0 ◽

1954 ◽

Vol 173 (4398) ◽

pp. 309-309 ◽

Cited By ~ 1

Author(s):

T. H. FLEWETT ◽

G. EAVES

Keyword(s):

High Resolution ◽

Electron Micrographs ◽

Tissue Sections ◽

Resolution Electron ◽

High Resolution Electron Micrographs

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Effect of three-fold astigmatism on high resolution electron micrographs

Ultramicroscopy ◽

10.1016/0304-3991(95)00050-b ◽

1995 ◽

Vol 60 (1) ◽

pp. 103-113 ◽

Cited By ~ 29

Author(s):

O.L Krivanek ◽

P.A Stadelmann

Keyword(s):

High Resolution ◽

Electron Micrographs ◽

Resolution Electron ◽

High Resolution Electron Micrographs

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