Information retrieval using a hypertext-based help system

Using the GOMS model (Card, Moran, and Newell, 1983), a help system was developed which was complete and well structured. The content of this help system was determined from the goals, operators, methods, and selection rules needed to perform HyperCard™ authoring tasks. The index to these methods, which was an integrated part of the system, was determined from the hierarchical goal tree provided by the GOMS analysis. To determine the effectiveness of using GOMS as a design aid for help systems, the GOMS help system was compared to a state-of-the art interface developed by Apple® Computer which was modified slightly for experimental purposes (Original help system). Two groups of 14 users, using one of the two help systems, retrieved help information about 56 tasks separated into 4 sessions. The results indicated that the GOMS users were significantly faster than the Original users with the largest speed difference occurring in the first session. However, no reliable differences were found for retrieval accuracy between the two groups. This is not surprising since the Original help system was found to have 85.9% of the procedural information contained in the GOMS help system. Interestingly, participants subjectively rated the GOMS help system higher than the Original help system. Overall, the results from this information retrieval study suggest that a GOMS model can aid in the development of help systems which are easy to use, easy to learn, and well liked.

Download Full-text

Information retrieval using a hypertext-based help system

ACM SIGIR Forum ◽

10.1145/75335.75357 ◽

1989 ◽

Vol 23 (SI) ◽

pp. 212-220 ◽

Cited By ~ 3

Author(s):

F. R. Campagnoni ◽

K. Erlich

Keyword(s):

Information Retrieval ◽

Help System

Download Full-text

Demonstration of the Use of Tape-Recorded Information from a High Vacuum Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100063007 ◽

1969 ◽

Vol 27 ◽

pp. 218-219

Author(s):

Richard E. Hartman ◽

Roberta S. Hartman ◽

Peter L. Ramos

Keyword(s):

Information Retrieval ◽

Electron Microscope ◽

Magnetic Tape ◽

High Vacuum ◽

Data Retrieval ◽

Electronic Information ◽

Electronic Data ◽

Subsequent Processing ◽

Continuous Record

We have long felt that some form of electronic information retrieval would be more desirable than conventional photographic methods in a high vacuum electron microscope for various reasons. The most obvious of these is the fact that with electronic data retrieval the major source of gas load is removed from the instrument. An equally important reason is that if any subsequent analysis of the data is to be made, a continuous record on magnetic tape gives a much larger quantity of data and gives it in a form far more satisfactory for subsequent processing.

Download Full-text

Stain contamination and embedding in electron microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100141986 ◽

1986 ◽

Vol 44 ◽

pp. 50-53

Author(s):

Hilton H. Mollenhauer

Keyword(s):

Electron Microscopy ◽

Information Retrieval ◽

Epoxy Resins ◽

Image Contrast ◽

Sample Preservation ◽

Factors Associated ◽

Amount Of Information ◽

Electron Microscopical ◽

Contrast Information

Many factors (e.g., resolution of microscope, type of tissue, and preparation of sample) affect electron microscopical images and alter the amount of information that can be retrieved from a specimen. Of interest in this report are those factors associated with the evaluation of epoxy embedded tissues. In this context, informational retrieval is dependant, in part, on the ability to “see” sample detail (e.g., contrast) and, in part, on tue quality of sample preservation. Two aspects of this problem will be discussed: 1) epoxy resins and their effect on image contrast, information retrieval, and sample preservation; and 2) the interaction between some stains commonly used for enhancing contrast and information retrieval.

Download Full-text

Information and Dose in the Scanning Transmission Ion Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s1431927600001021 ◽

1980 ◽

Vol 38 ◽

pp. 232-233

Author(s):

Fox T. R. ◽

R. Levi-Setti

Keyword(s):

Information Retrieval ◽

Electron Microscope ◽

Elastic Scattering ◽

Energy Loss ◽

Cross Sections ◽

Previous Analysis ◽

Single Scattering ◽

Screening Length ◽

Relative Damage ◽

Scanning Transmission

At an earlier meeting [1], we discussed information retrieval in the scanning transmission ion microscope (STIM) compared with the electron microscope at the same energy. We treated elastic scattering contrast, using total elastic cross sections; relative damage was estimated from energy loss data. This treatment is valid for “thin” specimens, where the incident particles suffer only single scattering. Since proton cross sections exceed electron cross sections, a given specimen (e.g., 1 μg/cm2 of carbon at 25 keV) may be thin for electrons but “thick” for protons. Therefore, we now extend our previous analysis to include multiple scattering. Our proton results are based on the calculations of Sigmund and Winterbon [2], for 25 keV protons on carbon, using a Thomas-Fermi screened potential with a screening length of 0.0226 nm. The electron results are from Crewe and Groves [3] at 30 keV.

Download Full-text