Output-based Intermediate Representation for Translation of Test-pattern Program

2019 ◽  
Vol 18 (5s) ◽  
pp. 1-22
Author(s):  
Minsu Kim ◽  
Jeong-Keun Park ◽  
Sungyeol Kim ◽  
Insu Yang ◽  
Hyunsoo Jung ◽  
...  
Keyword(s):  
Test Pattern ◽  
Intermediate Representation

The Utility of an Intermediate Representation of Feature Space: Lessons From Fingerprint Examiners

2012 ◽  
Author(s):  
Tom Busey ◽  
Chen Yu ◽  
Francisco Parada ◽  
Brandi Emerick ◽  
John Vanderkolk
Keyword(s):  
Feature Space ◽  
Intermediate Representation

Enabling Electro-Optical Failure Analysis within Extreme Compression Test Architecture

2016 ◽  
Author(s):  
Rudolf Schlangen ◽  
Jon Colburn ◽  
Joe Sarmiento ◽  
Bala Tarun Nelapatla ◽  
Puneet Gupta
Keyword(s):  
Failure Analysis ◽  
Compression Test ◽  
Test Pattern ◽  
Pattern Generation ◽  
Output Data ◽  
Test Compression ◽  
Test Loop ◽  
On Chip ◽  
Test Architecture

Abstract Driven by the need for higher test-compression, increasingly many chip-makers are adopting new DFT architectures such as “Extreme-Compression” (XTR, supported by Synopsys) with on-chip pattern generation and MISR based compression of chain output data. This paper discusses test-loop requirements in general and gives Advantest 93k specific guidelines on test-pattern release and ATE setup necessary to enable the most established EFA techniques such as LVP and SDL (aka DLS, LADA) within the XTR test architecture.

Dynamic Photon Emission on FinFET Devices Through Novel Scan Test Approaches

2019 ◽  
Author(s):  
Ranganathan Gopinath ◽  
Ravikumar Venkat Krishnan ◽  
Lua Winson ◽  
Phoa Angeline ◽  
Jin Jie
Keyword(s):  
Test Pattern ◽  
Photon Emission ◽  
Pattern Generator ◽  
Lower Probability ◽  
Automated Test Equipment ◽  
Use Patterns ◽  
Infra Red ◽  
Automatic Test Pattern Generator ◽  
Technology Nodes ◽  
Established Technique

Abstract Dynamic Photon Emission Microscopy (D-PEM) is an established technique for isolating short and open failures, where photons emitted by transistors are collected by sensitive infra-red detectors while the device under test is electrically exercised with automated test equipment (ATE). Common tests, such as scan, use patterns that are generated through Automatic Test Pattern Generator (ATPG) in compressed mode. When these patterns are looped for D-PEM, it results in indeterministic states within cells during the load or unload sequences, making interpretation of emission challenging. Moreover, photons are emitted with lower probability and lesser energies for smaller technology nodes such as the FinFET. In this paper, we will discuss executing scan tests in manners that can be used to bring out emission which did not show up in conventional test loops.

scholarly journals Correct program parallelisations

2021 ◽  
Author(s):  
S. Blom ◽  
S. Darabi ◽  
M. Huisman ◽  
M. Safari
Keyword(s):  
Composition Operators ◽  
Parallel Programs ◽  
Parallel Program ◽  
Tool Support ◽  
Intermediate Representation ◽  
Data Race ◽  
Sequential Program ◽  
Functional Correctness ◽  
Correct Program ◽  
Basic Blocks

AbstractA commonly used approach to develop deterministic parallel programs is to augment a sequential program with compiler directives that indicate which program blocks may potentially be executed in parallel. This paper develops a verification technique to reason about such compiler directives, in particular to show that they do not change the behaviour of the program. Moreover, the verification technique is tool-supported and can be combined with proving functional correctness of the program. To develop our verification technique, we propose a simple intermediate representation (syntax and semantics) that captures the main forms of deterministic parallel programs. This language distinguishes three kinds of basic blocks: parallel, vectorised and sequential blocks, which can be composed using three different composition operators: sequential, parallel and fusion composition. We show how a widely used subset of OpenMP can be encoded into this intermediate representation. Our verification technique builds on the notion of iteration contract to specify the behaviour of basic blocks; we show that if iteration contracts are manually specified for single blocks, then that is sufficient to automatically reason about data race freedom of the composed program. Moreover, we also show that it is sufficient to establish functional correctness on a linearised version of the original program to conclude functional correctness of the parallel program. Finally, we exemplify our approach on an example OpenMP program, and we discuss how tool support is provided.

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