Analysis of performance impact caused by power supply noise in deep submicron devices

Proceedings of the 36th ACM/IEEE conference on Design automation conference - DAC '99 ◽

10.1145/309847.310053 ◽

1999 ◽

Cited By ~ 35

Author(s):

Yi-Min Jiang ◽

Kwang-Ting Cheng

Keyword(s):

Power Supply ◽

Deep Submicron ◽

Power Supply Noise ◽

Performance Impact ◽

Supply Noise ◽

Submicron Devices ◽

Analysis Of Performance

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Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices

Signal Integrity Effects in Custom IC and ASIC Designs ◽

10.1109/9780470546413.ch31 ◽

2009 ◽

Keyword(s):

Power Supply ◽

Deep Submicron ◽

Power Supply Noise ◽

Performance Impact ◽

Supply Noise ◽

Submicron Devices ◽

Analysis Of Performance

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Analysis of performance impact caused by power supply noise in deep submicron devices

Proceedings 1999 Design Automation Conference (Cat. No. 99CH36361) ◽

10.1109/dac.1999.782118 ◽

2003 ◽

Cited By ~ 27

Author(s):

Yi-Min Jiang ◽

Kwang-Ting Cheng

Keyword(s):

Power Supply ◽

Deep Submicron ◽

Power Supply Noise ◽

Performance Impact ◽

Supply Noise ◽

Submicron Devices ◽

Analysis Of Performance

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Power Supply Noise Analysis Methodology For Deep-submicron Vlsi Chip Design

Proceedings of the 34th Design Automation Conference ◽

10.1109/dac.1997.597223 ◽

2005 ◽

Cited By ~ 162

Author(s):

H.H. Chen ◽

D.D. Ling

Keyword(s):

Power Supply ◽

Noise Analysis ◽

Deep Submicron ◽

Power Supply Noise ◽

Chip Design ◽

Analysis Methodology ◽

Vlsi Chip ◽

Supply Noise

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Vector generation for power supply noise estimation and verification of deep submicron designs

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/92.924055 ◽

2001 ◽

Vol 9 (2) ◽

pp. 329-340 ◽

Cited By ~ 27

Author(s):

Yi-Min Jiang ◽

Kwang-Ting Cheng

Keyword(s):

Power Supply ◽

Deep Submicron ◽

Noise Estimation ◽

Power Supply Noise ◽

Supply Noise ◽

Vector Generation

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Call for Papers: Special Issue on IR-Drop and Power Supply Noise Effects on Design and Test of Very Deep-Submicron Designs

IEEE Design & Test of Computers ◽

10.1109/mdt.2006.115 ◽

2006 ◽

Vol 23 (5) ◽

pp. 413-413

Keyword(s):

Power Supply ◽

Deep Submicron ◽

Power Supply Noise ◽

Special Issue ◽

Noise Effects ◽

Ir Drop ◽

Supply Noise

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Power supply noise analysis methodology for deep-submicron VLSI chip design

Proceedings of the 34th annual conference on Design automation conference - DAC '97 ◽

10.1145/266021.266307 ◽

1997 ◽

Cited By ~ 35

Author(s):

Howard H. Chen ◽

David D. Ling

Keyword(s):

Power Supply ◽

Noise Analysis ◽

Deep Submicron ◽

Power Supply Noise ◽

Chip Design ◽

Analysis Methodology ◽

Vlsi Chip ◽

Supply Noise

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Call for Papers: Special Issue on IR-Drop and Power Supply Noise Effects on Design and Test of Very Deep-Submicron Designs

IEEE Design & Test of Computers ◽

10.1109/mdt.2006.89 ◽

2006 ◽

Vol 23 (4) ◽

pp. 267-267

Keyword(s):

Power Supply ◽

Deep Submicron ◽

Power Supply Noise ◽

Special Issue ◽

Noise Effects ◽

Ir Drop ◽

Supply Noise

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AC Power Supply Noise Simulation of CMOS Microprocessor with LSI Chip-Package-Board Integrated Model

IEICE Transactions on Electronics ◽

10.1587/transele.e97.c.264 ◽

2014 ◽

Vol E97.C (4) ◽

pp. 264-271 ◽

Cited By ~ 1

Author(s):

Kumpei YOSHIKAWA ◽

Kouji ICHIKAWA ◽

Makoto NAGATA

Keyword(s):

Power Supply ◽

Integrated Model ◽

Power Supply Noise ◽

Supply Noise ◽

Noise Simulation ◽

Ac Power

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Power-Supply-Noise-Aware Timing Analysis and Test Pattern Regeneration

IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences ◽

10.1587/transfun.e99.a.2320 ◽

2016 ◽

Vol E99.A (12) ◽

pp. 2320-2327

Author(s):

Cheng-Yu HAN ◽

Yu-Ching LI ◽

Hao-Tien KAN ◽

James Chien-Mo LI

Keyword(s):

Power Supply ◽

Test Pattern ◽

Timing Analysis ◽

Power Supply Noise ◽

Supply Noise

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Power Supply Noise-Aware Scan Test Pattern Reshaping for At-Speed Delay Fault Testing of Monolithic 3D ICs *

2020 IEEE 29th Asian Test Symposium (ATS) ◽

10.1109/ats49688.2020.9301568 ◽

2020 ◽

Author(s):

Shao-Chun Hung ◽

Yi-Chen Lu ◽

Sung Kyu Lim ◽

Krishnendu Chakrabarty

Keyword(s):

Power Supply ◽

Test Pattern ◽

Power Supply Noise ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

3D Ics ◽

Scan Test ◽

Supply Noise

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