scholarly journals A Monte Carlo Method for Evaluating Scattering Cross Sections for Multi-Particle Production Processes

1970 ◽  
Vol 44 (4) ◽  
pp. 952-958 ◽  
Author(s):  
W. F. Long ◽  
J. S. Kovacs
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Method ◽  
Cross Sections ◽  
Particle Production ◽  
Scattering Cross ◽  
Production Processes ◽  
Scattering Cross Sections

The calculation of backscattered images for cross-section samples in the scanning electron microscope (SEM)

1992 ◽  
Vol 50 (2) ◽  
pp. 1312-1313
Author(s):  
T.D. Ly ◽  
D.G Howitt
Keyword(s):  
Monte Carlo ◽  
Cross Sections ◽  
Monte Carlo Techniques ◽  
Scattering Cross ◽  
Heterogeneous Samples ◽  
Composition Profiles ◽  
Image Position ◽  
Scattering Cross Sections ◽  
Image Simulations ◽  
Signal Intensities

The calculation of image contrast in heterogeneous samples can be done using Monte Carlo techniques if the electron trajectories can be calculated through the composition profiles in the specimen. Most of the programs that are available are designed to calculate signal intensities from samples of uniform atomic number and density (e.g Joy 1988, Reimer and Steltzer 1987) but some success has been achieved in the description of samples with distinct composition profiles by extrapolating these results.The image simulations we have done here are based upon Monte Carlo calculations of the electron backscattered signal from samples where the composition variations can be taken into account in determining both the elastic and inelastic scattering cross sections. This work involved extending the program developed by Joy (1988) and comparing the calculated signal intensities to the values derived experimentally from a specimen of well defined geometry. In the program the elastic scattering cross-sections, which describe the collisions of the electrons with the atomic nucleus are described by a Rutherford model given by(1)

Absolute inner-shell cross section determination for EELS analysis

1988 ◽  
Vol 46 ◽  
pp. 534-535
Author(s):  
P.A. Crozier
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Absolute Cross Section ◽  
Specimen Thickness ◽  
Mass Thickness ◽  
Scattering Cross ◽  
Before And After ◽  
Estimated Error ◽  
Scattering Cross Sections ◽  
Electron Microscopist

Absolute inelastic scattering cross sections or mean free paths are often used in EELS analysis for determining elemental concentrations and specimen thickness. In most instances, theoretical values must be used because there have been few attempts to determine experimental scattering cross sections from solids under the conditions of interest to electron microscopist. In addition to providing data for spectral quantitation, absolute cross section measurements yields useful information on many of the approximations which are frequently involved in EELS analysis procedures. In this paper, experimental cross sections are presented for some inner-shell edges of Al, Cu, Ag and Au.Uniform thin films of the previously mentioned materials were prepared by vacuum evaporation onto microscope cover slips. The cover slips were weighed before and after evaporation to determine the mass thickness of the films. The estimated error in this method of determining mass thickness was ±7 x 107g/cm2. The films were floated off in water and mounted on Cu grids.

scholarly journals Towards fully nonperturbative computations of inelastic ℓN scattering cross sections from lattice QCD

2020 ◽  
Vol 102 (11) ◽  
Author(s):  
Hidenori Fukaya ◽  
Shoji Hashimoto ◽  
Takashi Kaneko ◽  
Hiroshi Ohki
Keyword(s):  
Lattice Qcd ◽  
Cross Sections ◽  
Scattering Cross ◽  
Scattering Cross Sections

scholarly journals Combining ADF-EDX scattering cross-sections for elemental quantification of nanostructures

2021 ◽  
Vol 27 (S1) ◽  
pp. 600-602
Author(s):  
Zezhong Zhang ◽  
Annick De Backer ◽  
Ivan Lobato ◽  
Sandra Van Aert ◽  
Peter Nellist
Keyword(s):  
Cross Sections ◽  
Scattering Cross ◽  
Scattering Cross Sections
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