Substantial Contribution to a Cantilever Resonance Frequency Shift in Magnetic Resonance Force Microscopy

2009 ◽  
Vol 78 (3) ◽  
pp. 033602 ◽  
Author(s):  
Kohsuke Inomata ◽  
Shigenori Tsuji ◽  
Yohsuke Yoshinari ◽  
Hyun Soon Park ◽  
Daisuke Shindo
Keyword(s):  
Magnetic Resonance ◽  
Resonance Frequency ◽  
Frequency Shift ◽  
Substantial Contribution ◽  
Magnetic Resonance Force Microscopy ◽  
Force Microscopy ◽  
Resonance Frequency Shift

scholarly journals Quantum dynamics of the oscillating cantilever-driven adiabatic reversals in magnetic resonance force microscopy

2004 ◽  
Vol 4 (2) ◽  
pp. 102-113
Author(s):  
G.P. Berman ◽  
F. Borgonovi ◽  
V.I. Tsifrinovich
Keyword(s):  
Magnetic Resonance ◽  
Frequency Shift ◽  
Quantum Dynamics ◽  
Magnetic Resonance Force Microscopy ◽  
Force Microscopy ◽  
Similarities And Differences

We simulated the quantum dynamics for magnetic resonance force microscopy (MRFM) in the oscillating cantilever-driven adiabatic reversals (OSCAR) technique. We estimated the frequency shift of the cantilever vibrations and demonstrated that this shift causes the formation of a Schr\"odinger cat state which has some similarities and differences from the conventional MRFM technique which uses cyclic adiabatic reversals of spins. The interaction of the cantilever with the environment is shown to quickly destroy the coherence between the two possible cantilever trajectories. We have shown that using partial adiabatic reversals, one can produce a significant increase in the OSCAR signal.

scholarly journals Спин-обменные столкновения в системе K-Li

2019 ◽  
Vol 127 (10) ◽  
pp. 639
Author(s):  
В.А. Картошкин
Keyword(s):  
Magnetic Resonance ◽  
Resonance Frequency ◽  
Frequency Shift ◽  
Cross Sections ◽  
Spin Exchange ◽  
Resonance Frequency Shift ◽  
Magnetic Resonance Frequency ◽  
Complex Spin ◽  
Exchange Cross Section ◽  
First Time

AbstractSpin-exchange cross sections and the magnetic-resonance frequency shift in collision of lithium and potassium atoms in the ground state have been calculated for the first time. The cross sections are calculated based on the data on the singlet ( $$X{}^{1}{{\Sigma }^{ + }}$$ ) and triplet ( $$a{}^{3}{{\Sigma }^{ + }}$$ ) interaction potentials of ^39K^7Li dimer. A passage from the energy dependences to the temperature ones of the real and imaginary parts of the complex spin-exchange cross section yields information about both the broadening of the magnetic resonance line of the atoms under study and the magnetic-resonance frequency shift in their collision.

Reliability and stability of thin-film amorphous silicon MEMS on glass substrates

2011 ◽  
Vol 1299 ◽  
Author(s):  
P. M. Sousa ◽  
V. Chu ◽  
J. P. Conde
Keyword(s):  
Thin Film ◽  
Resonance Frequency ◽  
Frequency Shift ◽  
Amorphous Silicon ◽  
Structural Damage ◽  
Chemical Vapor ◽  
Stability Study ◽  
Glass Substrates ◽  
Resonance Frequency Shift ◽  
Mems Resonators

ABSTRACTIn this work, we present a reliability and stability study of doped hydrogenated amorphous silicon (n+-a-Si:H) thin-film silicon MEMS resonators. The n+-a-Si:H structural material was deposited using radio frequency plasma enhanced chemical vapor deposition (RF-PECVD) and processed using surface micromachining at a maximum deposition temperature of 110 ºC. n+-a-Si:H resonant bridges can withstand the industry standard of 1011 cycles at high load with no structural damage. Tests performed up to 3x1011 cycles showed a negligible level of degradation in Q during the entire cycling period which in addition shows the high stability of the resonator. In measurements both in vacuum and in air a resonance frequency shift which is proportional to the number of cycles is established. This shift is between 0.1 and 0.4%/1x1011 cycles depending on the applied VDC. When following the resonance frequency in vacuum during cyclic loading, desorption of air molecules from the resonator surface is responsible for an initial higher resonance frequency shift before the linear dependence is established.

Detection of liquids by magnetic resonance force microscopy in the gradient-on-cantilever geometry

2019 ◽  
Vol 298 ◽  
pp. 85-90
Author(s):  
Sebastian Schnoz ◽  
Alexander Däpp ◽  
Andreas Hunkeler ◽  
Beat H. Meier
Keyword(s):  
Magnetic Resonance ◽  
Magnetic Resonance Force Microscopy ◽  
Force Microscopy
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