Surface Roughness Effect on Secondary Electron Emission from Beryllium under Electron Bombardment

1994 ◽  
Vol 63 (2) ◽  
pp. 795-806 ◽  
Author(s):  
Jun Kawata ◽  
Kaoru Ohya
Keyword(s):  
Surface Roughness ◽  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Electron Bombardment ◽  
Roughness Effect

scholarly journals Substrate Temperature Dependent Microstructure and Electron-Induced Secondary Electron Emission Properties of Magnetron Sputter-Deposited Amorphous Carbon Films

Materials ◽  
2019 ◽  
Vol 12 (16) ◽  
pp. 2631 ◽  
Author(s):  
Jie Li ◽  
Xingkang Yi ◽  
Wenbo Hu ◽  
Buyu Gao ◽  
Yongdong Li ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Substrate Temperature ◽  
Amorphous Carbon ◽  
Electron Emission ◽  
Secondary Electron ◽  
Steel Substrate ◽  
Secondary Electron Emission ◽  
Negative Influence ◽  
Electron Bombardment ◽  
Particle Accelerators

For special instruments or equipments including particle accelerators, space microwave devices and spacecrafts, the suppression for electron-induced secondary electron emission (SEE) occurring on the component surfaces is of great significance due to a negative influence caused by SEE on their normal operations. In this paper, amorphous carbon (a-C) films were prepared on stainless-steel substrates by radio frequency magnetron sputtering, and the effects of substrate temperature (Ts) and continuous electron bombardment on the microstructure and secondary electron emission yield (SEY) of a-C film were investigated in order to achieve a better inhibition for SEE. The experimental results show that a rise of Ts during the a-C film preparation is conducive to a SEY reduction and an increase of multipactor threshold due to the increases of surface roughness and sp2 bond content. In addition, although the SEY of a-C film has a slight increase with the rise of electron bombardment time, the a-C film sample with a lower SEY keeps its lower SEY all the time during continuous electron bombardment. The a-C film prepared at Ts of 500 °C has the lowest SEY peak value of 1.09 with a reduction of 30.6% in comparison with the stainless-steel substrate.

Study of Secondary Electron Emission Depended on Surface Charge of Space Insulator Materials

2014 ◽  
Vol 716-717 ◽  
pp. 137-141
Author(s):  
Na Feng ◽  
De Tian Li ◽  
Sheng Sheng Yang ◽  
Yi Feng Chen ◽  
Dao Tang Tang ◽  
...  
Keyword(s):  
Mathematical Model ◽  
Electron Irradiation ◽  
Electron Emission ◽  
Essential Role ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Dielectric Surface ◽  
Electron Bombardment ◽  
Secondary Electrons ◽  
Surface Charging

Secondary electron emission (SEE) processes play an essential role in spacecraft surface charging. It is difficult to study SEE of insulator whose surface cumulates charges by incident electron bombardment because of poor conductivity. This paper investigated the theoretical process of generation, transfer and escape of secondary electrons, and finally the paper presented a mathematical model to calculate the secondary electron emission. We also have improved measurement system to measure total SEE coefficient from dielectric with 1-5 keV electron irradiation which is perfectly fit to mathematical model, and the SEE coefficient with different surface charging is investigated. The results indicate the SEE coefficient decreases with positive charging and increase with negative charging of dielectric surface.

Secondary electron emission under electron bombardment from graphene nanoplatelets

2014 ◽  
Vol 291 ◽  
pp. 74-77 ◽  
Author(s):  
Isabel Montero ◽  
Lydya Aguilera ◽  
María E. Dávila ◽  
Valentin C. Nistor ◽  
Luis A. González ◽  
...  
Keyword(s):  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Electron Bombardment ◽  
Graphene Nanoplatelets
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