Analysis of Elastic Scattering of Protons by O18 and the Energy Levels of F19

1962 ◽  
Vol 17 (4) ◽  
pp. 604-620 ◽  
Author(s):  
Kohsuke Yagi
Keyword(s):  
Elastic Scattering ◽  
Energy Levels

scholarly journals Energy Levels In 13N

1961 ◽  
Vol 14 (1) ◽  
pp. 196 ◽  
Author(s):  
VR McKenna ◽  
AM Baxter ◽  
GG Shute
Keyword(s):  
Elastic Scattering ◽  
Level Scheme ◽  
Energy Levels ◽  
Mirror Nucleus

The latest tabulation of energy levels in 13N (Ajzenberg-Selove and Lauritsen 1959) shows that there is a region from 8 �08 to 22�7 MeV which previously has been inaccessible to thorough investigation. Since the mirror nucleus, 130, has been thoroughly investigated and shows a well-defined level scheme in this region, it was decided to make a search for similar levels of the 13N nucleus in the excitation range 6� 5-12 . 5 MeV in this laboratory by means of elastic scattering of protons from 120.

Energy Levels ofN14from the Elastic Scattering ofαParticles byB10

1973 ◽  
Vol 8 (3) ◽  
pp. 972-977 ◽  
Author(s):  
T. Mo ◽  
H. R. Weller
Keyword(s):  
Elastic Scattering ◽  
Energy Levels

scholarly journals Study of (p,n) Reaction in a Wide Energy Range

2019 ◽  
pp. 1-18
Author(s):  
N. A. El-Nohy ◽  
M. N. El-Hammamy ◽  
S. Diab ◽  
A. M. El-Shinawy
Keyword(s):  
Elastic Scattering ◽  
Optical Model ◽  
Energy Levels ◽  
Model Potential ◽  
Wide Energy Range ◽  
Microscopic Approach ◽  
Density Dependent ◽  
Wide Range ◽  
Optical Model Potential ◽  
Wide Energy

In this paper, the quasi-elastic scattering (p, n) reactions are studied for a wide range of target nuclei 13C, 14C, 48Ca, 90Zr and 208Pb and different incident energies (35-160 MeV). The phenomenological Optical model potential and density independent approaches are used for these calculations in comparison with density dependent semi-microscopic approach. The density dependent parameters are modified to achieve the best calculations for many targets at different energy levels.

A Perturbation Theory for the Population of Atomic Energy Levels in Non-Lte Plasmas

1988 ◽  
Vol 102 ◽  
pp. 343-347
Author(s):  
M. Klapisch
Keyword(s):  
Perturbation Theory ◽  
Small Parameter ◽  
Classification Scheme ◽  
Sum Rules ◽  
Energy Levels ◽  
Natural Classification ◽  
Quantum Numbers ◽  
Formal Expansion ◽  
Atomic Energy Levels ◽  
As Effects

AbstractA formal expansion of the CRM in powers of a small parameter is presented. The terms of the expansion are products of matrices. Inverses are interpreted as effects of cascades.It will be shown that this allows for the separation of the different contributions to the populations, thus providing a natural classification scheme for processes involving atoms in plasmas. Sum rules can be formulated, allowing the population of the levels, in some simple cases, to be related in a transparent way to the quantum numbers.

Elastic Scattering in Electron Microscopy

1973 ◽  
Vol 31 ◽  
pp. 252-253
Author(s):  
J. Langmore ◽  
M. Isaacson ◽  
J. Wall ◽  
A. V. Crewe
Keyword(s):  
Electron Microscopy ◽  
Elastic Scattering ◽  
Cross Section ◽  
Quantum Noise ◽  
Dark Field ◽  
Elastic Cross Section ◽  
Biological Molecules ◽  
Dark Field Microscopy ◽  
Field Systems ◽  
Effects Of Radiation

High resolution dark field microscopy is becoming an important tool for the investigation of unstained and specifically stained biological molecules. Of primary consideration to the microscopist is the interpretation of image Intensities and the effects of radiation damage to the specimen. Ignoring inelastic scattering, the image intensity is directly related to the collected elastic scattering cross section, σɳ, which is the product of the total elastic cross section, σ and the eficiency of the microscope system at imaging these electrons, η. The number of potentially bond damaging events resulting from the beam exposure required to reduce the effect of quantum noise in the image to a given level is proportional to 1/η. We wish to compare η in three dark field systems.

The Resolution and Contrast in Biological Sections Determined by Inelastic and Elastic Scattering

1973 ◽  
Vol 31 ◽  
pp. 224-225
Author(s):  
D. L. Misell
Keyword(s):  
Electron Microscopy ◽  
Adverse Effect ◽  
Elastic Scattering ◽  
Inelastic Scattering ◽  
Amorphous Carbon ◽  
Polymeric Materials ◽  
Chromatic Aberration ◽  
Image Resolution ◽  
Quantitative Estimates ◽  
Elastic Ratio

In the electron microscopy of biological sections the adverse effect of chromatic aberration on image resolution is well known. In this paper calculations are presented for the inelastic and elastic image intensities using a wave-optical formulation. Quantitative estimates of the deterioration in image resolution as a result of chromatic aberration are presented as an alternative to geometric calculations. The predominance of inelastic scattering in the unstained biological and polymeric materials is shown by the inelastic to elastic ratio, I/E, within an objective aperture of 0.005 rad for amorphous carbon of a thickness, t=50nm, typical of biological sections; E=200keV, I/E=16.

A New Image Processing Technique for STEM

1974 ◽  
Vol 32 ◽  
pp. 432-433
Author(s):  
Yasushi Kokubo ◽  
Hirotami Koike ◽  
Teruo Someya
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Scanning Electron Microscopy ◽  
Elastic Scattering ◽  
Field Emission ◽  
Processing Technique ◽  
Image Processing Technique ◽  
Energy Analyzer ◽  
Scanning Microscope ◽  
Scanning Electron

One of the advantages of scanning electron microscopy is the capability for processing the image contrast, i.e., the image processing technique. Crewe et al were the first to apply this technique to a field emission scanning microscope and show images of individual atoms. They obtained a contrast which depended exclusively on the atomic numbers of specimen elements (Zcontrast), by displaying the images treated with the intensity ratio of elastically scattered to inelastically scattered electrons. The elastic scattering electrons were extracted by a solid detector and inelastic scattering electrons by an energy analyzer. We noted, however, that there is a possibility of the same contrast being obtained only by using an annular-type solid detector consisting of multiple concentric detector elements.

A Base Specific Single Heavy Atom Stain for Electron Microscopy

1972 ◽  
Vol 30 ◽  
pp. 184-185
Author(s):  
J. P. Langmore ◽  
N. R. Cozzarelli ◽  
A. V. Crewe
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
High Resolution ◽  
Elastic Scattering ◽  
Heavy Atom ◽  
High Vacuum ◽  
Heavy Atoms ◽  
Large Movement ◽  
Base Sequencing ◽  
Scanning Electron

A system has been developed to allow highly specific derivatization of the thymine bases of DNA with mercurial compounds wich should be visible in the high resolution scanning electron microscope. Three problems must be completely solved before this staining system will be useful for base sequencing by electron microscopy: 1) the staining must be shown to be highly specific for one base, 2) the stained DNA must remain intact in a high vacuum on a thin support film suitable for microscopy, 3) the arrangement of heavy atoms on the DNA must be determined by the elastic scattering of electrons in the microscope without loss or large movement of heavy atoms.

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