Diffusion and Electrical Properties of Iron-Related Defects in N-Type Silicon Grown by Czochralski- and Floating Zone Method
1998 ◽
Vol 37
(Part 1, No. 9A)
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pp. 4656-4662
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Keyword(s):
2016 ◽
Vol 42
(15)
◽
pp. 17283-17289
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1984 ◽
Vol 19
(11)
◽
pp. 3671-3679
◽
Keyword(s):
1991 ◽
Vol 92
(2)
◽
pp. 573-577
◽
Keyword(s):
1984 ◽
Vol 19
(11)
◽
pp. 3671-3679
◽
Keyword(s):
Keyword(s):