Direct Comparison of Fine Structure on Ti L3Threshold by Disappearance Potential and Auger Electron and Soft X-Ray Appearance Potential Spectroscopies

1984 ◽  
Vol 23 (Part 2, No. 6) ◽  
pp. L366-L368 ◽  
Author(s):  
Katsumi Nishimori ◽  
Heizo Tokutaka ◽  
Masahiro Kohno ◽  
Naganori Ishihara
Keyword(s):  
Fine Structure ◽  
Auger Electron ◽  
X Ray ◽  
Appearance Potential

Electron Spectroscopic Studies of the Oxidation of Ni/Pd Alloys

1976 ◽  
Vol 31 (2) ◽  
pp. 205-210 ◽  
Author(s):  
K. Wandelt ◽  
G. Ertl
Keyword(s):  
Binding Energy ◽  
Auger Electron Spectroscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Spectroscopic Studies ◽  
Oxide Layers ◽  
X Ray ◽  
Appearance Potential

Abstract The oxidation of polycrystalline samples of Ni/Pd-alloys at 600 °C and 2·10-5 Torr O2 has been investigated by means of Auger electron spectroscopy and soft x-ray appearance potential spectroscopy. The clean surfaces are enriched by Pd; and with increasing Pd content the binding energy of the Ni 2p-core levels was found to decrease continuously by 0.7 eV. After completion of the oxidation identical overlayers were formed on all samples (except on pure Pd!) which were identified to consist of NiO. Within the depth probed by the applied techniques (≲20 Å) the rate of oxidation was found to increase with increasing Pd content, which is in contrast to the behaviour to be expected for the growth of thick oxide layers after the formation of a coherent NiO overlayer.

Study of the Ti/Si interface using x‐ray photoelectron and Auger electron appearance potential spectroscopies

1987 ◽  
Vol 5 (4) ◽  
pp. 1984-1987 ◽  
Author(s):  
D. R. Chopra ◽  
A. R. Chourasia ◽  
T. R. Dillingham ◽  
Keith L. Peterson ◽  
B. Gnade
Keyword(s):  
Auger Electron ◽  
X Ray ◽  
Appearance Potential

Extended Core Edge Fine Structure in the E.M.

1980 ◽  
Vol 38 ◽  
pp. 120-121
Author(s):  
R.D. Leapman
Keyword(s):  
Fine Structure ◽  
Electron Scattering ◽  
Inelastic Electron ◽  
High Resolution Imaging ◽  
X Ray ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Core Electrons ◽  
Resolution Imaging ◽  
X Ray Absorption

Extended X-ray Absorption Fine Structure (EXAFS) analysis makes use of synchrotron radiaion to measure modulations in the absorption coefficient above core edges and hence to obtain information about local atomic environments. EXAFS arises when ejected core electrons are backscattered by surrounding atoms and interfere with the outgoing waves. Recently, interest has also been shown in using inelastic electron scattering1-4. Some advantages of Extended X-ray-edge Energy Loss Fine Structure (EXELFS) are: a) small probes formed by the analytical electron microscope give spectra from μm to nm sized areas, compared with mm diameter areas for the X-ray technique, b) EXELFS can be combined with other techniques such as electron diffraction or high resolution imaging, and c) EXELFS is sensitive to low Z elements with K edges from ˜200 eV to ˜ 3000 eV (B to Cl).

Some Aspects of Exelfs Analysis in the Electron Microscope

1980 ◽  
Vol 38 ◽  
pp. 118-119
Author(s):  
D. E. Johnson ◽  
S. Csillag
Keyword(s):  
Fine Structure ◽  
Electron Microscope ◽  
Energy Loss ◽  
Analytical Electron Microscopy ◽  
Interference Effects ◽  
Interatomic Distances ◽  
X Ray ◽  
Structure Information ◽  
Microanalytical Technique ◽  
Analytical Electron

Recently, the applications area of analytical electron microscopy has been extended to include the study of Extended Energy Loss Fine Structure (EXELFS). Modulations past an ionization edge in the energy loss spectrum (EXELFS), contain atomic fine structure information similar to Extended X-ray Absorbtion Fine Structure (EXAFS). At low momentum transfer the main contribution to these modulations comes from interference effects between the outgoing excited inner shell electron waves and electron waves backscattered from the surrounding atoms. The ability to obtain atomic fine structure information (such as interatomic distances) combined with the spatial resolution of an electron microscope is unique and makes EXELFS an important microanalytical technique.

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