Diffusion of Impurities in the Semiconductor Melt III. Experimental Determination of Thickness of the Solute Diffusion Layer in the Melting Process
1963 ◽
Vol 2
(4)
◽
pp. 227-232
◽
Keyword(s):
1979 ◽
Vol 40
(C7)
◽
pp. C7-709-C7-710
Keyword(s):
2010 ◽
Vol 130
(10)
◽
pp. 1817-1818
Keyword(s):