Accurate Measurement of Lattice Constants in a Wide Range of Temperature: Use of White X-Rays and Double-Crystal Diffractometry

1973 ◽  
Vol 12 (6) ◽  
pp. 783-789 ◽  
Author(s):  
Atsushi Okazaki ◽  
Masaru Kawaminami
Keyword(s):  
X Rays ◽  
Double Crystal ◽  
Lattice Constants ◽  
Wide Range

Position of exit X-rays from rotated-inclined double-crystal monochromators

1998 ◽  
Vol 5 (3) ◽  
pp. 679-681 ◽  
Author(s):  
Yasuharu Kashihara ◽  
Hiroshi Yamazaki ◽  
Kenji Tamasaku ◽  
Tetsuya Ishikawa
Keyword(s):  
Heat Load ◽  
Diffraction Theory ◽  
Third Generation ◽  
X Rays ◽  
Double Crystal ◽  
Undulator Radiation ◽  
X Ray ◽  
Double Crystal Monochromator ◽  
Asymmetric Reflection ◽  
Wide Range

The rotated-inclined double-crystal monochromator (RIDCM) has been adopted to reduce the heat load from third-generation undulator radiation. The position of the exit X-rays from RIDCM has been calculated as a function of X-ray energy on the basis of diffraction theory including refraction effects. The results show that the positions of the exit X-rays vary over a wide range due to asymmetric reflection. Methods of fixing the exit position in RIDCM are also discussed.

scholarly journals Diamond beamline I07: a beamline for surface and interface diffraction

2016 ◽  
Vol 23 (5) ◽  
pp. 1245-1253 ◽  
Author(s):  
Chris Nicklin ◽  
Tom Arnold ◽  
Jonathan Rawle ◽  
Adam Warne
Keyword(s):  
Photoelectron Spectroscopy ◽  
Accurate Determination ◽  
Ultrahigh Vacuum ◽  
Grazing Incidence ◽  
X Rays ◽  
Scanning Tunnelling Microscope ◽  
X Ray Diffraction ◽  
Double Crystal ◽  
X Ray ◽  
Wide Range

Beamline I07 at Diamond Light Source is dedicated to the study of the structure of surfaces and interfaces for a wide range of sample types, from soft matter to ultrahigh vacuum. The beamline operates in the energy range 8–30 keV and has two endstations. The first houses a 2+3 diffractometer, which acts as a versatile platform for grazing-incidence techniques including surface X-ray diffraction, grazing-incidence small- (and wide-) angle X-ray scattering, X-ray reflectivity and grazing-incidence X-ray diffraction. A method for deflecting the X-rays (a double-crystal deflector) has been designed and incorporated into this endstation, extending the surfaces that can be studied to include structures formed on liquid surfaces or at liquid–liquid interfaces. The second experimental hutch contains a similar diffractometer with a large environmental chamber mounted on it, dedicated toin situultrahigh-vacuum studies. It houses a range of complementary surface science equipment including a scanning tunnelling microscope, low-energy electron diffraction and X-ray photoelectron spectroscopy ensuring that correlations between the different techniques can be performed on the same sample, in the same chamber. This endstation allows accurate determination of well ordered structures, measurement of growth behaviour during molecular beam epitaxy and has also been used to measure coherent X-ray diffraction from nanoparticles during alloying.

Lattice Curvature in Nearly Perfect Silicon Crystals

1973 ◽  
Vol 28 (7) ◽  
pp. 1199-1204
Author(s):  
R. Bubáková ◽  
Z. Trousil
Keyword(s):  
Dynamical Theory ◽  
X Rays ◽  
Dislocation Loops ◽  
Crystal Spectrometer ◽  
Double Crystal ◽  
Lattice Curvature ◽  
Lattice Constants ◽  
Silicon Crystals ◽  
Anomalous Transmission ◽  
Lattice Planes

Deviations from Friedel's law in the case of anomalous transmission of X-rays have been estimated in as-grown silicon crystals. The results of measurements on a double crystal spectrometer agree with the dynamical theory of elastically deformed crystals. Using this theory, we have obtained information about growth deformation in crystals containing a small number of dislocations or in dislocation-free ones. Radii of curvature of crystal lattice planes of the order of km, orientation differences of the order of 0.1" and relative changes of lattice constants of the order of 10-3% have been estimated. Dislocation loops were observed at the boundary between the dislocation-free and the distorted part of the crystal.

A Color Coded STEM/SEM Image Storage System

1981 ◽  
Vol 39 ◽  
pp. 272-273
Author(s):  
Y. Kokubo ◽  
W. H. Hardy ◽  
J. Dance ◽  
K. Jones
Keyword(s):  
Image Processing ◽  
Electron Beam ◽  
Storage System ◽  
Particle Analysis ◽  
Specific Information ◽  
X Rays ◽  
Sem Image ◽  
Backscattered Electrons ◽  
Wide Range ◽  
Scanning Electron

A color coded digital image processing is accomplished by using JEM100CX TEM SCAN and ORTEC’s LSI-11 computer based multi-channel analyzer (EEDS-II-System III) for image analysis and display. Color coding of the recorded image enables enhanced visualization of the image using mathematical techniques such as compression, gray scale expansion, gamma-processing, filtering, etc., without subjecting the sample to further electron beam irradiation once images have been stored in the memory.The powerful combination between a scanning electron microscope and computer is starting to be widely used 1) - 4) for the purpose of image processing and particle analysis. Especially, in scanning electron microscopy it is possible to get all information resulting from the interactions between the electron beam and specimen materials, by using different detectors for signals such as secondary electron, backscattered electrons, elastic scattered electrons, inelastic scattered electrons, un-scattered electrons, X-rays, etc., each of which contains specific information arising from their physical origin, study of a wide range of effects becomes possible.

Detector commissioning and development for PETRA-III

2010 ◽  
Vol 1 (SRMS-7) ◽  
Author(s):  
David Pennicard ◽  
Heinz Graafsma ◽  
Michael Lohmann
Keyword(s):  
High Speed ◽  
Materials Science ◽  
Dynamic Range ◽  
Photon Counting ◽  
High Energy ◽  
X Rays ◽  
Silicon Detectors ◽  
Time Resolved ◽  
Wide Range ◽  
Synchrotron Light

The new synchrotron light source PETRA-III produced its first beam last year. The extremely high brilliance of PETRA-III and the large energy range of many of its beamlines make it useful for a wide range of experiments, particularly in materials science. The detectors at PETRA-III will need to meet several requirements, such as operation across a wide dynamic range, high-speed readout and good quantum efficiency even at high photon energies. PETRA-III beamlines with lower photon energies will typically be equipped with photon-counting silicon detectors for two-dimensional detection and silicon drift detectors for spectroscopy and higher-energy beamlines will use scintillators coupled to cameras or photomultiplier tubes. Longer-term developments include ‘high-Z’ semiconductors for detecting high-energy X-rays, photon-counting readout chips with smaller pixels and higher frame rates and pixellated avalanche photodiodes for time-resolved experiments.

scholarly journals Towards an accurate description of perovskite ferroelectrics: exchange and correlation effects

2017 ◽  
Vol 7 (1) ◽  
Author(s):  
Simuck F. Yuk ◽  
Krishna Chaitanya Pitike ◽  
Serge M. Nakhmanson ◽  
Markus Eisenbach ◽  
Ying Wai Li ◽  
...  
Keyword(s):  
Density Functional ◽  
General Purpose ◽  
Correlation Effects ◽  
Lattice Constants ◽  
Bulk Solids ◽  
Wide Range ◽  
Exchange Enhancement ◽  
Experimental Values ◽  
Similar Accuracy ◽  
Ferroelectric Oxides

Abstract Using the van der Waals density functional with C09 exchange (vdW-DF-C09), which has been applied to describing a wide range of dispersion-bound systems, we explore the physical properties of prototypical ABO 3 bulk ferroelectric oxides. Surprisingly, vdW-DF-C09 provides a superior description of experimental values for lattice constants, polarization and bulk moduli, exhibiting similar accuracy to the modified Perdew-Burke-Erzenhoff functional which was designed specifically for bulk solids (PBEsol). The relative performance of vdW-DF-C09 is strongly linked to the form of the exchange enhancement factor which, like PBEsol, tends to behave like the gradient expansion approximation for small reduced gradients. These results suggest the general-purpose nature of the class of vdW-DF functionals, with particular consequences for predicting material functionality across dense and sparse matter regimes.

Spatial imaging of monochromatic hard x‐rays from an APS undulator by the Kohzu double‐crystal monochromator (abstract)

1996 ◽  
Vol 67 (9) ◽  
pp. 3348-3348
Author(s):  
D.M. Mills ◽  
W.K. Lee ◽  
M. Keeffe ◽  
D.R. Haeffner ◽  
P. Fernandez
Keyword(s):  
X Rays ◽  
Double Crystal ◽  
Double Crystal Monochromator

scholarly journals The XXL Survey

2018 ◽  
Vol 620 ◽  
pp. A18 ◽  
Author(s):  
C. H. A. Logan ◽  
B. J. Maughan ◽  
M. N. Bremer ◽  
P. Giles ◽  
M. Birkinshaw ◽  
...  
Keyword(s):  
Angular Resolution ◽  
False Positive Rate ◽  
High Sensitivity ◽  
Point Sources ◽  
Selection Function ◽  
X Rays ◽  
Cluster Emission ◽  
X Ray ◽  
Wide Range ◽  
Function Modelling

Context. The XMM-XXL survey has used observations from the XMM-Newton observatory to detect clusters of galaxies over a wide range in mass and redshift. The moderate PSF (FWHM ~ 6″ on-axis) of XMM-Newton means that point sources within or projected onto a cluster may not be separated from the cluster emission, leading to enhanced luminosities and affecting the selection function of the cluster survey. Aims. We present the results of short Chandra observations of 21 galaxy clusters and cluster candidates at redshifts z > 1 detected in the XMM-XXL survey in X-rays or selected in the optical and infra-red. Methods. With the superior angular resolution of Chandra, we investigate whether there are any point sources within the cluster region that were not detected by the XMM-XXL analysis pipeline, and whether any point sources were misclassified as distant clusters. Results. Of the 14 X-ray selected clusters, 9 are free from significant point source contamination, either having no previously unresolved sources detected by Chandra or with less than about 10% of the reported XXL cluster flux being resolved into point sources. Of the other five sources, one is significantly contaminated by previously unresolved AGN, and four appear to be AGN misclassified as clusters. All but one of these cases are in the subset of less secure X-ray selected cluster detections and the false positive rate is consistent with that expected from the XXL selection function modelling. We also considered a further seven optically selected cluster candidates associated with faint XXL sources that were not classed as clusters. Of these, three were shown to be AGN by Chandra, one is a cluster whose XXL survey flux was highly contaminated by unresolved AGN, while three appear to be uncontaminated clusters. By decontaminating and vetting these distant clusters, we provide a pure sample of clusters at redshift z > 1 for deeper follow-up observations, and demonstrate the utility of using Chandra snapshots to test for AGN in surveys with high sensitivity but poor angular resolution.

A multi-length-scale USAXS/SAXS facility: 10–50 keV small-angle X-ray scattering instrument

2013 ◽  
Vol 46 (5) ◽  
pp. 1508-1512 ◽  
Author(s):  
Byron Freelon ◽  
Kamlesh Suthar ◽  
Jan Ilavsky
Keyword(s):  
Small Angle ◽  
Soft Matter ◽  
High Energy ◽  
X Rays ◽  
X Ray ◽  
X Ray Scattering ◽  
Wide Range ◽  
And Performance ◽  
New Facility ◽  
Ray Scattering

Coupling small-angle X-ray scattering (SAXS) and ultra-small-angle X-ray scattering (USAXS) provides a powerful system of techniques for determining the structural organization of nanostructured materials that exhibit a wide range of characteristic length scales. A new facility that combines high-energy (HE) SAXS and USAXS has been developed at the Advanced Photon Source (APS). The application of X-rays across a range of energies, from 10 to 50 keV, offers opportunities to probe structural behavior at the nano- and microscale. An X-ray setup that can characterize both soft matter or hard matter and high-Zsamples in the solid or solution forms is described. Recent upgrades to the Sector 15ID beamline allow an extension of the X-ray energy range and improved beam intensity. The function and performance of the dedicated USAXS/HE-SAXS ChemMatCARS-APS facility is described.

scholarly journals Recurrent Novae — A Review

2015 ◽  
Vol 2 (1) ◽  
pp. 246-251 ◽  
Author(s):  
K. Mukai
Keyword(s):  
Accretion Rate ◽  
Current Understanding ◽  
X Rays ◽  
Symbiotic Star ◽  
Classical Novae ◽  
Extensive Data ◽  
Star Evolution ◽  
Wide Range ◽  
Multi Wavelength ◽  
Recurrent Nova

In recent years, recurrent nova eruptions are often observed very intensely in wide range of wavelengths from radio to optical to X-rays. Here I present selected highlights from recent multi-wavelength observations. The enigma of T Pyx is at the heart of this paper. While our current understanding of CV and symbiotic star evolution can explain why certain subset of recurrent novae have high accretion rate, that of T Pyx must be greatly elevated compared to the evolutionary mean. At the same time, we have extensive data to be able to estimate how the nova envelope was ejected in T Pyx, and it turns to be a rather complex tale. One suspects that envelope ejection in recurrent and classical novae in general is more complicated than the textbook descriptions. At the end of the review, I will speculate that these two may be connected.

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