Factors affecting recruitment of Pinuspungens in the southern Appalachian Mountains

1992 ◽  
Vol 22 (6) ◽  
pp. 878-887 ◽  
Author(s):  
Charles E. Williams ◽  
W. Carter Johnson

Factors affecting the establishment and recruitment of seedlings of the Appalachian endemic Pinuspungens Lamb were studied in pine–oak forests of dry, southwesterly mountain slopes in southwestern Virginia, United States. Recruitment of P. pungens was not limited by seedfall from serotinous cones or by postdispersal seed predation. Total viable seedfall ranged from 35 000 to 69 000 seeds/ha in 1988 and was concentrated in the spring and summer months. Low availability of suitable seedling habitat strongly limited recruitment of P. pungens seedlings. The distributions of habitat variables for P. pungens seedlings and random points in the forest overlapped little, indicating that suitable microsites were relatively rare. Seedlings occurred in microsites characterized by shallow pine litter, low ground and canopy covers, and larger nearest neighbor distances than occurred at random. Summer drought also contributed to low seedling survivorship, particularly in young seedlings. Our results suggest that optimal recruitment and population maintenance of P. pungens in pine–oak forests is unlikely in the absence of fire.

2007 ◽  
Vol 15 (3) ◽  
pp. 400-411 ◽  
Author(s):  
Charles W. Lafon ◽  
John D. Waldron ◽  
David M. Cairns ◽  
Maria D. Tchakerian ◽  
Robert N. Coulson ◽  
...  

Author(s):  
S. R. Herd ◽  
P. Chaudhari

Electron diffraction and direct transmission have been used extensively to study the local atomic arrangement in amorphous solids and in particular Ge. Nearest neighbor distances had been calculated from E.D. profiles and the results have been interpreted in terms of the microcrystalline or the random network models. Direct transmission electron microscopy appears the most direct and accurate method to resolve this issue since the spacial resolution of the better instruments are of the order of 3Å. In particular the tilted beam interference method is used regularly to show fringes corresponding to 1.5 to 3Å lattice planes in crystals as resolution tests.


Castanea ◽  
2019 ◽  
Vol 84 (2) ◽  
pp. 128
Author(s):  
John R. Butnor ◽  
Brittany M. Verrico ◽  
Kurt H. Johnsen ◽  
Christopher A. Maier ◽  
Victor Vankus ◽  
...  

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