The properties of a family of two-headed surfactant systems: the 4-alkyl-3-sulfosuccinates 2. Surface properties of alkyl sulfosuccinate micelles

1999 ◽  
Vol 77 (3) ◽  
pp. 340-347 ◽  
Author(s):  
Judith A MacInnis ◽  
Greg D Boucher ◽  
R Palepu ◽  
D Gerrard Marangoni

The micellar properties of a family of two-headed surfactants, the alkyl sulfosuccinates, were investigated employing fluorescence, ultra-violet spectroscopy, and acid-base titrations, as a function of the chain length of the surfactant. Polarity of the micellar interior was investigated using pyrene and the ionic probe 8-anilino-1-naphthalensulfonic acid ammonium salt (ANS). Pyrene I1/I3 ratios were used to probe the microenvironment of the probe in the palisade layer of the micelle. The pKa values of both of the anionic head groups were determined using acid-base titrations. Surface potential measurements were obtained from the measurement of the pKa of the hydrophobic indicator, 7-hydroxycoumarin, at the sulfosuccinate micellar interface. All of these results were used to examine the surface properties of the alkyl sulfosuccinate micelles and the polarity of the micellar interior.Key words: micellization, pKa, surface potential, surface charge density, 7-hydroxycoumarin, pyrene.

2016 ◽  
Vol 483 ◽  
pp. 353-359 ◽  
Author(s):  
Takafumi Shimoaka ◽  
Yuki Tanaka ◽  
Nobutaka Shioya ◽  
Kohei Morita ◽  
Masashi Sonoyama ◽  
...  

2020 ◽  
Vol 22 (35) ◽  
pp. 20123-20142
Author(s):  
Hadi Saboorian-Jooybari ◽  
Zhangxin Chen

This research work is directed at development of accurate physics-based formulas for quantification of curvature-dependence of surface potential, surface charge density, and total surface charge for cylindrical and spherical charged particles immersed in a symmetrical electrolyte solution.


2009 ◽  
Vol 154 ◽  
pp. 95-100 ◽  
Author(s):  
Seiichi Miyazaki ◽  
Mitsuhisa Ikeda ◽  
Katsunori Makihara ◽  
K. Shimanoe ◽  
R. Matsumoto

We demonstrated a new fabrication method of Pt- and Ni-silicide nanodots with an areal density of the order of ~1011 cm-2 on SiO2 through the process steps of ultrathin metal film deposition on pre-grown Si-QDs and subsequent remote H2 plasma treatments at room temperature. Verification of electrical separation among silicide nanodots was made by measuring surface potential changes due to electron injection and extraction using an AFM/Kelvin probe technique. Photoemission measurements confirm a deeper potential well of silicide nanodots than Si-QDs and a resultant superior charge retention was also verified by surface potential measurements after charging to and discharging. Also, the advantage in many electron storage per silicide nanodot was demonstrated in C-V characteristics of MIS capacitors with silicide nanodots FGs.


2017 ◽  
Vol 121 (50) ◽  
pp. 28017-28030 ◽  
Author(s):  
Sarah M. Walker ◽  
Maria C. Marcano ◽  
Sooyeon Kim ◽  
Sandra D. Taylor ◽  
Udo Becker

2012 ◽  
Vol 370 (1) ◽  
pp. 111-116 ◽  
Author(s):  
Bo Cai ◽  
Xuefeng Li ◽  
Yi Yang ◽  
Jinfeng Dong

1988 ◽  
Vol 64 (5) ◽  
pp. 2638-2647 ◽  
Author(s):  
M. P. Connolly ◽  
D. H. Michael ◽  
R. Collins

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