Reflectance spectroscopic determination of cobalt, nickel, and copper with pyridine-2-aldehyde-2-quinolylhydrazone

1968 ◽  
Vol 46 (2) ◽  
pp. 167-173 ◽  
Author(s):  
R. W. Frei ◽  
R. Liiva ◽  
D. E. Ryan
Keyword(s):  
Diffuse Reflectance ◽  
Diffuse Reflectance Spectroscopy ◽  
Reflectance Spectroscopy ◽  
Good Reproducibility ◽  
Optimum Conditions ◽  
Cobalt Nickel ◽  
Nickel Cobalt ◽  
Cellulose Layers ◽  
Layer Chromatography

Nickel, cobalt, and copper are separated from interfering metals by thin-layer chromatography on silica gel and cellulose layers. The metals are sprayed with pyridine-2-aldehyde-2-quinolylhydrazone solution and determined by diffuse reflectance spectroscopy. Under optimum conditions, 0.01 µg per spot can be determined easily and with good reproducibility.

scholarly journals Absorption and Remission Characterization of Pure, Dielectric (Nano-)Powders Using Diffuse Reflectance Spectroscopy: An End-To-End Instruction

2019 ◽  
Vol 9 (22) ◽  
pp. 4933 ◽  
Author(s):  
Sergej Bock ◽  
Christian Kijatkin ◽  
Dirk Berben ◽  
Mirco Imlau
Keyword(s):  
Diffuse Reflectance ◽  
Diffuse Reflectance Spectroscopy ◽  
Mie Scattering ◽  
Reflectance Spectroscopy ◽  
Visible Spectral Range ◽  
Host Matrix ◽  
Material Sciences ◽  
End To End

This paper addresses the challenging task of optical characterization of pure, dielectric (nano-)powders with the aim to provide an end-to-end instruction from appropriate sample preparation up to the determination of material remission and absorption spectra. We succeeded in establishing an innovative preparation procedure to reproducibly obtain powder pellet samples with an ideal Lambertian scattering behavior. As a result, a procedure based on diffuse reflectance spectroscopy was developed that allows for (i) performing reproducible and artifact-free, high-quality measurements as well as (ii) a thorough optical analysis using Monte Carlo and Mie scattering simulations yielding the absorption spectrum in the visible spectral range. The procedure is valid for the particular case of powders that can be compressed into thick, non-translucent pellets and neither requires embedding of the dielectric (nano-)powders within an appropriate host matrix for measurements nor the use of integrating spheres. The reduced spectroscopic procedure minimizes the large number of sources for errors, enables an in-depth understanding of non-avoidable artifacts and is of particular advantage in the field of material sciences, i.e., for getting first insights to the optical features of a newly synthesized, pure dielectric powder, but also as an inline inspection tool for massively parallelised material characterization.

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