Erratum: Angular distribution of optical photons from β decay of oriented nuclei

1994 ◽  
Vol 72 (9-10) ◽  
pp. 697-701
Author(s):  
A. M. Al-Harkan
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Angular Distribution ◽  
Electron Scattering ◽  
Pure Water ◽  
Β Decay ◽  
Secondary Electrons ◽  
Transparent Media ◽  
Optical Photons ◽  
Polarization States

Internal and external optical bremsstrahlung accompanying the β decay of polarized nuclei were investigated. The features of angular distribution of light photons were analyzed taking into account multiple electron scattering. Monte-Carlo simulation was used to study the fate of β electrons and to calculate the intensity and angular distribution of the optical photons. It is shown that in pure water, the contribution of secondary electrons in the production of photons reaches 30–40%. We suggest using the angular distribution of optical photons to study the polarization states of β isotopes imbedded in transparent media.

Angular distribution of optical photons from β decay of oriented nuclei

1994 ◽  
Vol 72 (5-6) ◽  
pp. 210-214 ◽  
Author(s):  
A. M. Al-Harkan
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Angular Distribution ◽  
Electron Scattering ◽  
Pure Water ◽  
Β Decay ◽  
Secondary Electrons ◽  
Transparent Media ◽  
Optical Photons ◽  
Polarization States

Internal and external optical bremsstrahlung accompanying the β decay of polarized nuclei were investigated. The features of angular distribution of light photons were analyzed taking into account multiple electron scattering. Monte-Carlo simulation was used to study the fate of β electrons and to calculate the intensity and angular distribution of the optical photons. It is shown that in pure water, the contribution of secondary electrons in the production of photons reaches 30–40%. We suggest using the angular distribution of optical photons to study the polarization states of β isotopes imbedded in transparent media.

Electron Scattering in Solids

1990 ◽  
Vol 48 (2) ◽  
pp. 4-5
Author(s):  
Ryuichi Shimizu ◽  
Ze-Jun Ding
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Angular Distribution ◽  
Elastic Scattering ◽  
Electron Scattering ◽  
Cross Sections ◽  
Expansion Method ◽  
Electron Excitation ◽  
Partial Wave Expansion ◽  
Backscattered Electrons

Monte Carlo simulation has been becoming most powerful tool to describe the electron scattering in solids, leading to more comprehensive understanding of the complicated mechanism of generation of various types of signals for microbeam analysis.The present paper proposes a practical model for the Monte Carlo simulation of scattering processes of a penetrating electron and the generation of the slow secondaries in solids. The model is based on the combined use of Gryzinski’s inner-shell electron excitation function and the dielectric function for taking into account the valence electron contribution in inelastic scattering processes, while the cross-sections derived by partial wave expansion method are used for describing elastic scattering processes. An improvement of the use of this elastic scattering cross-section can be seen in the success to describe the anisotropy of angular distribution of elastically backscattered electrons from Au in low energy region, shown in Fig.l. Fig.l(a) shows the elastic cross-sections of 600 eV electron for single Au-atom, clearly indicating that the angular distribution is no more smooth as expected from Rutherford scattering formula, but has the socalled lobes appearing at the large scattering angle.

Software tool for advanced Monte Carlo simulation of electron scattering in EBL and SEM: CHARIOT

2003 ◽  
Author(s):  
Sergey V. Babin ◽  
S. Borisov ◽  
E. Cheremukhin ◽  
Eugene Grachev ◽  
V. Korol ◽  
...  
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Electron Scattering ◽  
Software Tool

Parallel Monte Carlo Simulation Using Desktop Computers

1999 ◽  
Vol 5 (S2) ◽  
pp. 80-81
Author(s):  
John Henry J. Scott ◽  
Robert L. Myklebust ◽  
Dale E. Newbury
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Electron Scattering ◽  
Information Needs ◽  
Image Interpretation ◽  
Scattered Electron ◽  
Electron Trajectories ◽  
X Ray ◽  
Desktop Computers ◽  
Computationally Expensive

Monte Carlo simulation of electron scattering in solids has proven valuable to electron microscopists for many years. The electron trajectories, x-ray generation volumes, and scattered electron signals produced by these simulations are used in quantitative x-ray microanalysis, image interpretation, experimental design, and hypothesis testing. Unfortunately, these simulations are often computationally expensive, especially when used to simulate an image or survey a multidimensional region of parameter space.Here we present techniques for performing Monte Carlo simulations in parallel on a cluster of existing desktop computers. The simulation of multiple, independent electron trajectories in a sample and the collateral calculation of detected x-ray and electron signals falls into a class of computational problems termed “embarrassingly parallel”, since no information needs to be exchanged between parallel threads of execution during the calculation. Such problems are ideally suited to parallel multicomputers, where a manager process distributes the computational burden over a large number of nodes.

EFFECTS OF SURFACE LOSS IN REELS SPECTRA OF SILVER

1997 ◽  
Vol 04 (05) ◽  
pp. 955-958 ◽  
Author(s):  
K. TÖKÉSI ◽  
L. KÖVÉR ◽  
D. VARGA ◽  
J. TÓTH ◽  
T. MUKOYAMA
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Energy Loss ◽  
Electron Scattering ◽  
Primary Beam ◽  
Monte Carlo Simulation Technique ◽  
Surface Normal ◽  
Beam Incidence ◽  
Polycrystalline Silver ◽  
Electron Energy Loss

The energy distribution of the electrons backscattered in the direction of the surface normal of polycrystalline silver samples was studied using reflected electron energy loss spectroscopy (REELS) at 200 eV and 2 keV primary beam energies. For modeling the electron scattering processes, the Monte Carlo simulation technique was used and the REELS spectra were calculated at various (25°, 50° and 75°, with respect to the surface normal) angles of primary beam incidence. The effects of the surface energy loss process in REELS are evaluated from the comparison of the experimental and simulated spectra.

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