Measurement of thermal inertia by the reflective-cavity method

1986 ◽  
Vol 64 (9) ◽  
pp. 1217-1220 ◽  
Author(s):  
P. Cielo ◽  
S. Dallaire ◽  
G. Lamonde ◽  
S. Johar
Keyword(s):  
Thermal Inertia ◽  
Thermal Characterization ◽  
Ceramic Materials ◽  
Quality Monitoring ◽  
Cavity Method ◽  
Photothermal Techniques ◽  
Surface Emissivity ◽  
Thermal Fields ◽  
Properties Of Materials

The measurement of thermal parameters is a useful tool for the evaluation of compositional or structural properties of materials of industrial interest. The increasing use of noncontact photothermal techniques to generate and sense thermal fields in materials makes thermal characterization an attractive approach for in-plant quality monitoring and process control. In an effort to increase the reliability of such measurements in conditions of unknown surface emissivity, an integrating-cavity technique is described for a quantitative evaluation of the thermal inertia of the inspected material. An analysis of the performance of such a technique as a function of the cavity geometry and internal reflectivity is presented. Examples of applications to the characterization of manufactured ceramic materials with different porosity contents are described.

Thermal Characterization of Carbon Nanotubes by Photothermal Techniques

2014 ◽  
Vol 36 (5-6) ◽  
pp. 1349-1357 ◽  
Author(s):  
G. Leahu ◽  
R. Li Voti ◽  
M. C. Larciprete ◽  
C. Sibilia ◽  
M. Bertolotti ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Thermal Characterization ◽  
Photothermal Techniques

Photothermal Techniques Applied to the Thermal Characterization of l–Cysteine Nanofluids

2012 ◽  
Vol 34 (5) ◽  
pp. 948-954 ◽  
Author(s):  
E. Maldonado Alvarado ◽  
E. Ramón-Gallegos ◽  
J. L. Jiménez Pérez ◽  
A. Cruz-Orea ◽  
J. Hernández Rosas
Keyword(s):  
Thermal Characterization ◽  
Photothermal Techniques

scholarly journals Erratum to: Complementary photothermal techniques for complete thermal characterization of porous and semi-transparent solids

2014 ◽  
Vol 119 (2) ◽  
pp. 1471-1471
Author(s):  
D. Dadarlat ◽  
M. Streza ◽  
O. Onija ◽  
C. Prejmerean ◽  
L. Silaghi-Dumitrescu ◽  
...  
Keyword(s):  
Thermal Characterization ◽  
Photothermal Techniques

Thermal characterization of a liquid resin for 3D printing using photothermal techniques

2016 ◽  
Vol 122 (5) ◽  
Author(s):  
José L. Jiménez-Pérez ◽  
Pavel Vieyra Pincel ◽  
Alfredo Cruz-Orea ◽  
Zormy N. Correa-Pacheco
Keyword(s):  
3D Printing ◽  
Thermal Characterization ◽  
Photothermal Techniques ◽  
Liquid Resin

Photothermal Techniques for Thermal Characterization of Linear Alcohols

2018 ◽  
Vol 39 (10) ◽  
Author(s):  
J. A. Balderas-López ◽  
M. R. Jaime-Fonseca ◽  
G. Gálvez Coyt ◽  
A. Muñoz-Diosdado ◽  
J. A. Pescador ◽  
...  
Keyword(s):  
Thermal Characterization ◽  
Photothermal Techniques ◽  
Linear Alcohols

Complementary photothermal techniques for complete thermal characterization of porous and semi-transparent solids

2014 ◽  
Vol 119 (1) ◽  
pp. 301-308 ◽  
Author(s):  
D. Dadarlat ◽  
M. Streza ◽  
O. Onija ◽  
C. Prejmerean ◽  
L. Silaghi-Dumitrescu ◽  
...  
Keyword(s):  
Thermal Characterization ◽  
Photothermal Techniques

Photothermal Techniques for Materials Characterization and Live Cells Monitoring

2009 ◽  
Vol 74 ◽  
pp. 101-104
Author(s):  
George C.K. Chen ◽  
Srivathsan Vasudevan ◽  
Teu Choon Kiat
Keyword(s):  
Thin Films ◽  
Phase Contrast ◽  
High Spatial Resolution ◽  
Mdck Cells ◽  
Thermal Characterization ◽  
Live Cells ◽  
Photothermal Techniques ◽  
20 Nm ◽  
Conductivity Of Thin Films

Photothermal technology can be applied for thermal characterization of thin films and studying biological live cells. Using pulsed photothermal reflectance technique, thermal conductivity of thin films ranging from 20 nm to a few microns can be determined. Photothermal imaging (PTI) technique can provide ultra high spatial resolution and no fluorescence molecules are required. Comparison with normal phase contrast images, PT images reveal temperature distribution and more information on the intracellular components. Photothermal response (PTR) technique can provide high temporal resolutions. In monitoring the dying process of MDCK cells, significant changes in the PTR signals can be observed whereas unnoticeable changes are found in the images.

Interface structures in polycrystalline ceramic materials

1986 ◽  
Vol 44 ◽  
pp. 468-471
Author(s):  
K. J. Morrissey
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Physical And Mechanical Properties ◽  
High Resolution Electron Microscopy ◽  
Ceramic Materials ◽  
Polycrystalline Materials ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Interface Structures

Grain boundaries and interfaces play an important role in determining both physical and mechanical properties of polycrystalline materials. To understand how the structure of interfaces can be controlled to optimize properties, it is necessary to understand and be able to predict their crystal chemistry. Transmission electron microscopy (TEM), analytical electron microscopy (AEM,), and high resolution electron microscopy (HREM) are essential tools for the characterization of the different types of interfaces which exist in ceramic systems. The purpose of this paper is to illustrate some specific areas in which understanding interface structure is important. Interfaces in sintered bodies, materials produced through phase transformation and electronic packaging are discussed.

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