Revised and extended analysis of the 3d10nl configurations in As V, Se VI, and Br VII

1986 ◽  
Vol 64 (3) ◽  
pp. 330-333 ◽  
Author(s):  
Y. N. Joshi ◽  
Th. A. M. Van Kleef
Keyword(s):  
Wavelength Region ◽  
Normal Incidence ◽  
Extended Analysis

The spectra of arsenic, selenium, and bromine were photographed in the wavelength region 450–2000 Å on 6.65- and 3-m normal-incidence spectrographs using a triggered spark source. The new observations have led us to revise and extend the As V, Se VI, and Br VII spectra.

Broadband multilayer-coated normal incidence blazed grating with ~10% diffraction efficiency through the 13-16 nm wavelength region

2009 ◽  
Vol 34 (6) ◽  
pp. 818 ◽  
Author(s):  
Lichao Zhang ◽  
Hui Lin ◽  
Chunshui Jin ◽  
Hongjun Zhou ◽  
Tonglin Huo
Keyword(s):  
Diffraction Efficiency ◽  
Wavelength Region ◽  
Normal Incidence ◽  
Blazed Grating

Revised and extended analysis of Cd IV

1980 ◽  
Vol 58 (6) ◽  
pp. 737-743 ◽  
Author(s):  
Y. N. Joshi ◽  
Th. A. M. van Kleef ◽  
M. Mazzoni
Keyword(s):  
Normal Incidence ◽  
Extended Analysis

The spectrum of cadmium was photographed in the region 500–2100 Å using a 10.7 m normal incidence spectrograph and a 6.65 m normal incidence spectrograph. The sources used were a triggered spark and a sliding spark. The earlier analysis has been revised and extended. All levels of the 4d85s and 4d85p configurations have been determined. Parametric level fitting calculations support the analysis. Three hundred and seventeen lines have been classified in this spectrum of which 209 are new lines.

Normal-Incidence Multilayer Mirrors for the 120–450 Å Wavelength Region

1990 ◽  
Vol 2 (4) ◽  
pp. 241-248
Author(s):  
S. V. Gaponov ◽  
S. A. Gusev ◽  
V. V. Dubrov ◽  
A. I. Kuzmichev ◽  
B. M. Luskin ◽  
...  
Keyword(s):  
Wavelength Region ◽  
Normal Incidence ◽  
Multilayer Mirrors

Normal-incidence efficiencies in the 115–340-Å wavelength region of replicas of the Skylab 3600-line/mm grating with multilayer and gold coatings

1995 ◽  
Vol 34 (28) ◽  
pp. 6453 ◽  
Author(s):  
J. F. Seely ◽  
M. P. Kowalski ◽  
W. R. Hunter ◽  
T. W. Barbee ◽  
R. G. Cruddace ◽  
...  
Keyword(s):  
Wavelength Region ◽  
Normal Incidence

On-blaze operation of a Mo/Si multilayer-coated, concave diffraction grating in the 136–142-Å wavelength region and near normal incidence

1993 ◽  
Vol 32 (25) ◽  
pp. 4890 ◽  
Author(s):  
J. F. Seely ◽  
M. P. Kowalski ◽  
W. R. Hunter ◽  
J. C. Rife ◽  
T. W. Barbee ◽  
...  
Keyword(s):  
Diffraction Grating ◽  
Wavelength Region ◽  
Normal Incidence ◽  
Concave Diffraction Grating ◽  
Concave Diffraction

scholarly journals Optical Properties of Thin Germanium Films

1972 ◽  
Vol 25 (6) ◽  
pp. 743 ◽  
Author(s):  
RE Denton ◽  
SG Tomlin
Keyword(s):  
Optical Constants ◽  
Wavelength Region ◽  
Normal Incidence ◽  
Random Structure ◽  
Amorphous Films ◽  
Amorphous Germanium ◽  
Long Wavelength ◽  
Wide Range ◽  
Germanium Films ◽  
Absorption Law

The refractive and absorption indices of thin amorphous germanium films have been obtained from measurements, at normal incidence, of reflectances and transmittances over a wide range of wavelengths. The optical constants derived were in general agreement with the results of Tauc et al. (1964) except in the long wavelength region beyond the absorption edge. The absorption followed the law for indirect transitions from 0�72 to 1�1 eV, and the same law, but with a change in the slope of the curves, from 1�1 eV to the limit of our measurements at about 1�5 eV. The results are consistent with the view that the energy band structure of amorphous germanium is not essentially different from that of the crystalline material, except that the random structure eliminates the restriction that allows only direct transitions with the result that the absorption law for amorphous films is of the same form as for indirect transitions in crystals.

Analysis and Optimisation of Two-Dimensional Silicon Complex Grating With Different Ridge Heights or Groove Depths for Solar Cells

2013 ◽  
Author(s):  
Pingping Li ◽  
Qiang Cheng ◽  
Hao Wu ◽  
Jinlin Song ◽  
Huaichun Zhou
Keyword(s):  
Solar Cells ◽  
Near Infrared ◽  
Fdtd Method ◽  
Wavelength Region ◽  
Normal Incidence ◽  
Groove Depth ◽  
Radiative Properties ◽  
Two Dimensional ◽  
Infrared Wavelength ◽  
Solar Absorber

In this study, two kinds of two-dimensional (2D) complex gratings are proposed for a potential application as absorbing surfaces for solar cells in the visible and near-infrared wavelength regions, which are based on the superposition of multiple 2D simple gratings with different ridge heights for convex gratings or different groove depths for concave gratings, respectively. Silicon is selected as the complex grating material because it is common in micro/nanofabrication. Compared with one-dimensional (1D) gratings, the new structures present excellent radiative properties to rays from all directions. Besides, the new gratings can achieve satisfactory performance under both TM and TE waves, which cannot be easily obtained by 1D gratings. Furthermore, these two kinds of 2D complex gratings can both achieve higher absorptance in the whole of the interested spectral range by making full use of the microcavity resonance than 2D simple gratings with the same ridge height or groove depth. Taguchi method is employed as an efficient way of searching for the optimal profiles for the 2D complex gratings. The average spectral absorptance of the optimized structure for the 2D complex convex grating with two different ridge heights is above 0.93 within wavelength region from 0.3 to 1.1 μm for both TM and TE waves under normal incidence, which suggests that the proposed structures can be well suitable for solar absorber applications. The Finite-different time-domain (FDTD) method is used for all numerical calculations to obtain spectral absorptance of different structures.

Thin-film interference effects on the efficiency of a normal-incidence grating in the 100–350-Å wavelength region

1999 ◽  
Vol 38 (7) ◽  
pp. 1251 ◽  
Author(s):  
John F. Seely ◽  
Leonid I. Goray ◽  
William R. Hunter ◽  
Jack C. Rife
Keyword(s):  
Thin Film ◽  
Wavelength Region ◽  
Normal Incidence ◽  
Interference Effects ◽  
Thin Film Interference

Extended analysis of Cu IV; The wavelength region 700–1200 Å

Physica B+C ◽  
1980 ◽  
Vol 100 (3) ◽  
pp. 389-403 ◽  
Author(s):  
E. Meinders ◽  
P. Uijlings
Keyword(s):  
Wavelength Region ◽  
Extended Analysis

SOFT X-RAY REFLECTIVITY AND THERMAL STABILITY OF CoCr/C MULTILAYER X-RAY MIRRORS

2002 ◽  
Vol 09 (01) ◽  
pp. 593-596 ◽  
Author(s):  
H. TAKENAKA ◽  
K. NAGAI ◽  
H. ITO ◽  
S. ICHIMARU ◽  
T. SAKUMA ◽  
...  
Keyword(s):  
Thermal Stability ◽  
Magnetron Sputtering ◽  
Critical Parameter ◽  
Incident Angle ◽  
Wavelength Region ◽  
Normal Incidence ◽  
Photoemission Spectroscopy ◽  
Multilayer Mirrors ◽  
X Ray ◽  
Thermal Stability Of

The development of highly reflective multilayer mirrors for use in the wavelength region around 6 nm is desired for X-ray photoemission spectroscopy for inner-shell excitation using a Schwarzschild objective. For this application, reflectivity is the most critical parameter determining the performance of multilayer mirrors, because the reflectivity of multilayers in the 6 nm region is generally very low. We have designed CoCr/C multilayer mirrors with a comparatively high reflectivity at around normal incidence and have fabricated them by magnetron sputtering. The measured peak reflectivity is about 16% at a wavelength of around 6 nm and an incident angle of 88°. The reflectivity remains almost constant for 4 h under 300°C in an Ar atmosphere.

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